Ohmic contacts to semiconducting diamond von Moazed, K.L., Nguyen, R., Zeidler, J.R.

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On the contact angle in heterogeneous nucleation upon a substrate von Moazed, K.L., Hirth, J.P.

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A stable indium-phosphide diffused junction field-effect transistor with high gain and low leakage von Zeisse, C.R., Nguyen, R., Messick, L.J., Saunier, P., Moazed, K.L.

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Discuss of the paper von Moazed, K.L.

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THE MECHANISM OF OXIDE FORMATION IN THE INITIAL STAGES OF OXIDATION von RAUSCH,D.W, MOAZED,K.L, FONTANA,M.G

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THE MECHANISM OF OXIDE FORMATION IN THE INITIAL STAGES OF OXIDATION von RAUSCH,D.W, MOAZED,K.L, FONTANA,M.G

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THE MECHANISM OF OXIDE FORMATION IN THE INITIAL STAGES OF OXIDATION von RAUSCH,D.W, MOAZED,K.L, FONTANA,M.G

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THE MECHANISM OF OXIDE FORMATION IN THE INITIAL STAGES OF OXIDATION von RAUSCH,D.W, MOAZED,K.L, FONTANA,M.G

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THE MECHANISM OF OXIDE FORMATION IN THE INITIAL STAGES OF OXIDATION von RAUSCH,D.W, MOAZED,K.L, FONTANA,M.G

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Comments on observed streaking in field-ion microscopy images of tungsten-10 at. % rhenium von Clum, J.A., Moazed, K.L.

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A field-ion microscopy study of a tungsten-3 at.% rhenium alloy: Streak contrast effects von Soffa, W.A., Moazed, K.L.

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