Investigation of secondary hardening in Co–35Ni–20Cr–10Mo alloy using analytical scanning transmission electron microscopy von Sorensen, D., Li, B.Q., Gerberich, W.W., Mkhoyan, K.A.

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Effects of tilt on high-resolution ADF-STEM imaging von Maccagnano-Zacher, S.E., Mkhoyan, K.A., Kirkland, E.J., Silcox, J.

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Separation of bulk and surface-losses in low-loss EELS measurements in STEM von Mkhoyan, K.A., Babinec, T., Maccagnano, S.E., Kirkland, E.J., Silcox, J.

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Carbon combustion synthesis of Janus-like particles of magnetoelectric cobalt ferrite and barium titanate von De Leo, C. Trevino, Dannangoda, G.C., Hobosyan, M.A., Held, J.T., Samghabadi, F. Safi, Khodadadi, M., Litvinov, D., Mkhoyan, K.A., Martirosyan, K.S.

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The role of back stress in sub-50 nm Si nanocubes von Hintsala, E.D., Wagner, A.J., Gerberich, W.W., Mkhoyan, K.A.

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The role of back stress in sub-50nm Si nanocubes von Hintsala, E.D., Wagner, A.J., Gerberich, W.W., Mkhoyan, K.A.

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Effects of amorphous layers on ADF-STEM imaging von Mkhoyan, K.A., Maccagnano-Zacher, S.E., Kirkland, E.J., Silcox, J.

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Direct Determination of Local Lattice Polarity in Crystals von Mkhoyan, K.A, Batson, P.E, Cha, J, Schaff, W.J, Silcox, J

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Electron Beam Channeling in Single Atomic Column von Mittal, A., Mkhoyan, K.A.

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Effects of Charge Transfer in Atomic Bonding on HAADF-STEM Image Simulation von Odlyzko, M.L., Mkhoyan, K.A.

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Investigation of Secondary Hardening in MP35N Wires von Sorensen, D., Li, B.Q., Gerberich, W.W., Mkhoyan, K.A.

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Analytical STEM Study of P-Doped Silicon Nanocrystals Exhibiting Mid-Infrared Localized Surface Plasmon Resonance von Jeong, J.S., Rowe, D.J., Kortshagen, U.R., Mkhoyan, K.A.

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The Contribution of Back Stress to Strength in Nanomaterials von Wagner, A.J., Hintsala, E.D., Kortshagen, U.R., Gerberich, W.W., Mkhoyan, K.A.

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In-Situ TEM Compression of MgO Nanocubes von Hintsala, E.D., Wagner, A.J., Suri, P.K., Mkhoyan, K.A., Gerberich, W.W.

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Indirect transitions in thin films due to the coulomb interactions between electrons von Kazaryan, E.M., Mkhoyan, K.A., Sarkisyan, H.A.

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Indirect transitions caused by electron—dislocation interaction in size-quantized semiconductor film von Kazaryan, E.M., Mkhoyan, K.A., Sarkisyan, H.A.

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