Externally-triggerable optical pump-probe scanning tunneling microscopy with a time resoloution of tens-picosecond von Iwaya, Katsuya, Yokota, Munenori, Hanada, Hiroaki, Mogi, Hiroyuki, Yoshida, Shoji, Takeuchi, Osamu, Miyatake, Yutaka, Shigekawa, Hidemi

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Variable-temperature independently driven four-tip scanning tunneling microscope von Hobara, Rei, Nagamura, Naoka, Hasegawa, Shuji, Matsuda, Iwao, Yamamoto, Yuko, Miyatake, Yutaka, Nagamura, Toshihiko

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Conductance of Si nanowires formed by breaking Si-Si junctions von Iwanari, Tomoki, Sakata, Toyo, Miyatake, Yutaka, Kurokawa, Shu, Sakai, Akira

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In Situ Microfabrication and Measurements of Bi2Se3 Ultrathin Films in a Multichamber System with a Focused Ion Beam, Molecular Beam Epitaxy, and Four-Tip Scanning Tunneling Micros... von Fukui, Naoya, Hobara, Rei, Hirahara, Toru, Hasegawa, Shuji, Miyatake, Yutaka, Mizuno, Hiroyuki, Sasaki, Toru, Nagamura, Toshihiko

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Externally-triggerable optical pump-probe scanning tunneling microscopy with a time resolution of tens-picosecond von Iwaya, Katsuya, Yokota, Munenori, Hanada, Hiroaki, Mogi, Hiroyuki, Yoshida, Shoji, Takeuchi, Osamu, Miyatake, Yutaka, Shigekawa, Hidemi

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Total analysis of surface structure and properties by UHV transfer system von Yamatani, Hiroshi, Hattori, Ken, Matsuta, Takahisa, Ito, Takuji, Nohno, Tomohito, Hori, Madoka, Miyatake, Yutaka, Konno, Shigenori, Tanaka, Tsukasa, Hamada, Yoji, Katagiri, Hiroshi, Hibi, Mikiharu, Miyai, Toshiki, Hashimoto, Mie, Kataoka, Keita, Tatsuta, Takeshi, Hattori, Azusa N., Higashi, Naoto, Honda, Mitsunori, Masunaga, Norifumi, Mino, Hiroaki, Yasui, Shintaro, Nayeem, Janathul, Shimizu, Tatsuya, Takahashi, Nobuaki, Kato, Yukako, Sakai, Chikako, Yoshimura, Masashi, Takeda, Sakura N., Matsui, Fumihiko, Daimon, Hiroshi

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Development of Scanning Probe Microscope for Auger Analysis von Miyatake, Yutaka, Nagamura, Toshihiko, Hattori, Ken, Kanemitsu, Yoshihiko, Daimon, Hiroshi

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Development of Electron Source for Auger Electron Spectroscopy in Scanning Probe Microscope Systems von Miyatake, Yutaka, Nagamura, Toshihiko, Hattori, Ken, Kanemitsu, Yoshihiko, Daimon, Hiroshi

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Surface Electrical Conductivity Measurement System with Micro-Four-Point Probes at Sub-Kelvin Temperature under High Magnetic Field in Ultrahigh Vacuum von Yamada, Manabu, Hirahara, Toru, Hobara, Rei, Hasegawa, Shuji, Mizuno, Hiroyuki, Miyatake, Yutaka, Nagamura, Toshihiko

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Application of atomic stereomicroscope to surface science von Nakatani, Takeshi, Matsushita, Tomohiro, Miyatake, Yutaka, Nohno, Tomohito, Kobayashi, Atsushi, Fukumoto, Keiki, Okamoto, Shunsuke, Nakamoto, Azusa, Matsui, Fumihiko, Hattori, Ken, Kotsugi, Masato, Saitoh, Yuji, Suga, Shigemasa, Daimon, Hiroshi

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Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantilevers von Shiraki, Ichiro, Miyatake, Yutaka, Nagamura, Toshihiko, Miki, Kazushi

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Demonstration of low-temperature atomic force microscopewith atomic resolution using piezoresistive cantilevers von Shiraki, Ichiro, Miyatake, Yutaka, Nagamura, Toshihiko, Miki, Kazushi

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Externally-triggerable optical pump-probe scanning tunneling microscopy with a time resolution of tens-picosecond von Iwaya, Katsuya, Yokota, Munenori, Hanada, Hiroaki, Mogi, Hiroyuki, Yoshida, Shoji, Takeuchi, Osamu, Miyatake, Yutaka, Shigekawa, Hidemi

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Variable-temperature independently driven four-tip scanningtunneling microscope von Hobara, Rei, Nagamura, Naoka, Hasegawa, Shuji, Matsuda, Iwao, Yamamoto, Yuko, Miyatake, Yutaka, Nagamura, Toshihiko

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Spin polarized photoelectron diffraction on Fe/W(110) excited by circularly polarized light von KOTSUGI, Masato, MIYATAKE, Yutaka, KOBAYASHI, Atsushi, FUKUMOTO, Keiki, NAKATANI, Takeshi, MATSUSHITA, Tomohiro, HATTORI, Ken, DAIMON, Hiroshi

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Circularly polarized light Photoelectron diffraction (PED) by 2-dimentional analyzer at SPring-8 II von KOTSUGI, Masato, MIYATAKE, Yutaka, ENOMOTO, Kazunori, NAKATANI, Takeshi, SAITO, Yuji, MATSUSHITA, Tomohiro, IMADA, Shin, FURUHATA, Takeo, SUGA, Shigemasa, SODA, Kazuo, JINNO, Masafumi, HIRANO, Takahide, HATTORI, Ken, DAIMON, Hiroshi

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Structure analysis of Si(001) by Circularly polarized light Photoelectron diffraction(PED) von KOTSUGI, Masato, MIYATAKE, Yutaka, ENOMOTO, Kazunori, NAKATANI, Takeshi, SAITOH, Yuji, MATSUSHITA, Tomohiro, IMADA, Shin, FURUHATA, Takeo, SUGA, Shigemasa, SODA, Kazuo, JINNO, Masafumi, HIRANO, Takahide, HATTORI, Ken, DAIMON, Hiroshi

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25pYC-2 Photoelectron diffraction(PED)by 2-dimentional analyzer at SPring-8 von KOTSUGI, Masato, ENOMOTO, Kazunori, MIYATAKE, Yutaka, NAKATANI, Takeshi, SAITOH, Yuji, MATSUSHITA, Tomohiro, IMADA, Shin, FURUHATA, Takeo, SUGA, Shigemasa, SODA, Kazuo, JINNO, Masafumi, HIRANO, Takahide, HATTORI, Ken, DAIMON, Hiroshi

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23pXC-3 Fe/W(110)における円偏光スピン偏極光電子回折 von 小嗣, 真人, 宮武, 優, 小林, 篤史, 福本, 恵紀, 中谷, 健, 松下, 智裕, 服部, 賢, 大門, 寛

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23aM-2 SPring-8二次元光電子分析器による円偏光光電子回折II von 小嗣, 真人, 宮武, 優, 榎本, 一紀, 中谷, 健, 斎藤, 祐児, 松下, 智裕, 今田, 真, 古畑, 武夫, 菅, 滋正, 曽田, 一雄, 神野, 正文, 平野, 隆英, 服部, 賢, 大門, 寛

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