Determination of Si/SiO 2 interfacial roughness using weak localization von Anderson, W.R., Lombardi, D.R., Mitev, P.H., Ma, T.P., Wheeler, R.G.

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Determination of Si/SiO2 interfacial roughness using weak localization von Anderson, W.R., Lombardi, D.R., Mitev, P.H., Ma, T.P., Wheeler, R.G.

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Determination of Si/SiO/sub 2/ interface roughness using weak localization von Anderson, W.R., Lombardi, D.R., Wheeler, R.G., Ma, T.P., Mitev, P.H.

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Low temperature transport of n-type gallium nitride von Chong, G., Reed, M.A., Gaffey, B., Gheriasmova, M., Mitev, P.H., Guido, L.J.

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