Assesment of a model to calculate the refractive index of AlXGa1-XN epilayers using the multi-oscillator model simulation of the infrared reflectance von Engelbrecht, J.A.A., Minnaar, E.G., van Dyk, E.E., Westraadt, J.E., Sephton, B., Lee, M.E., Henry, A.

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Microstructural Characterization of Polycrystalline Diamond Sintered at Ultrahigh Pressures von Minnaar, E.G., Westraadt, J.E., Neethling, J.H.

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On the refractive index of InSbxAs1-X von Engelbrecht, J. A. A., Botha, J. R., Dobson, S., Minnaar, E. G., O'Connell, J., Goosen, W. E.

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The influence of neutron-irradiation at low temperatures on the dielectric parameters of 3C-SiC von Engelbrecht, J.A.A., Deyzel, G., Minnaar, E.G., Goosen, W.E., van Rooyen, I.J.

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Prevalence of rhinoviruses in young children of an unselected birth cohort from the Netherlands von Wildenbeest, J.G., van der Schee, M.P., Hashimoto, S., Benschop, K.S.M., Minnaar, R.P., Sprikkelman, A.B., Haarman, E.G., van Aalderen, W.M.C., Sterk, P.J., Pajkrt, D., Wolthers, K.C.

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