Ellipsometric scatterometry for the metrology of sub-01-μm-linewidth structures von Minhas, Babar K., Coulombe, Stephen A., Naqvi, S. Sohail H., McNeil, John R.

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Identity of the cross-reflection coefficients for symmetric surface-relief gratings von Logofătu, Petre C., Coulombe, Stephen A., Minhas, Babar K., McNeil, John R.

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Enhanced infrared transmission through subwavelength coaxial metallic arrays von WENJUN FAN, SHUANG ZHANG, MINHAS, Babar, MALLOY, Kevin J, BRUECK, S. R. J

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The effects of an electromagnetic crystal substrate on a microstrip patch antenna von Agi, K., Mojahedi, M., Minhas, B., Schamiloglu, E., Malloy, K.J.

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