Mixed cells in directional solidification of In-doped GaAs; cellular profile and shape-induced stresses von Minari, F., Billia, B.

Volltext

Back-reflection topographic study of mixed cells in LEC-grown GaAs 0.2 at.% In von Minari, F, Billia, B

Volltext

Quantitative determination of the recombining activities of 60° and screw dislocations in float zone and Czochralski-grown silicon von MARIANI, J. L, PICHAUD, B, MINARI, F, MARTINUZZI, S

Volltext

Dislocation curvature by kink migration in a non-uniform stress field application to dislocation loops in silicon von Pichaud, B., Minari, F.

Volltext

Interactions of in atoms with partial dislocations cores in GaAs: 0.3% In von Burle-Durbec, N., Pichaud, B., Minari, F.

Volltext

Capabilities of X-ray topography for studying interfacial instabilities during directional solidification von Pichaud, B., Minari, F., Billia, B.

Volltext

Study of dislocations in highly in doped GaAs crystals grown by liquid encapsulation czochralski technique von Pichaud, B., Burle-Durbec, N., Minari, F., Duseaux, M.

Volltext

Dislocation velocity measurements in semi-insulating In-doped GaAs von Burle-Durbec, N., Pichaud, B., Minari, F.

Volltext

LBIC measurements of the recombining activity of dislocations in float zone silicon von Mariani, J.L., Pichaud, B., Minari, F., Martinuzzi, S.

Volltext

Comparison between the activities of fresh and aged dislocation sources in GaAs: 0.2 at% In von Burle-Durbec, N., Rakotoé, A., Pichaud, B., Minari, F.

Volltext

Dislocation motion by double-kink migration in a bent crystal Velocity measurements in silicon von Pichaud, B., Jean, P., Minari, F.

Volltext

Identification of Burgers vectors along in In-doped GaAs, by X-ray transmission topography and image simulation von Burle-Durbec, N., Pichaud, B., Minari, F., Soyer, A., Epelboin, Y.

Volltext

Calculation of critical shapes and stresses of surface sources of dislocations von Pichaud, B., Minari, F., Kellerhals, J.

Volltext

Further topographic observations of zigzag stress-induced dislocations in copper crystals von Pichaud, B., Minari, F.

Volltext

Growth of high perfection Ag-Sn crystals von Pichaud, B., Minari, F., Bernardini, J.

Volltext

Selection of the glide systems activated at low stresses in copper von Pichaud, B., Burle, M., Minari, F.

Volltext

X-ray topographic observation of dislocation multiplication by cross-slip in Cu crystals von Minari, F., Pichaud, B., Capella, L.

Volltext

Production of a large planar array of Lomer-Cottrell locks in silver by controlled mechanical straining von Minari, F., Pichaud, B., Burle, M.

Volltext

On the origin of disclocations observed by X-ray topography during microdeformation tests on f.c.c. metals von Kellbrhals, J., Minari, F., Pichaud, B.

Volltext

X-ray topographic analysis of a particular dislocation-dislocation interaction inducing cross-slip von Minari, F., Pichaud, B., Capella, L.

Volltext