Exception of the effect of the harmonic component in monochromatic synchrotron radiation using a special ionization chamber von Egikian, D.L., Mikaelian, R.A., Hovakimian, G.G.

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The spectral dependence of the integral coefficient of the forbidden (222) reflection, measured for distorted silicon samples von Karabekov, I.P., Egikian, D.L., Mikaelian, R.A.

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Measurements of diffraction parameters of Y 3Al 5O 12 in a wide band of wavelenghts from 0.06 to 0.2 nm von Karabekov, I.P., Egikian, D.L., Mikaelian, R.A., Bagdasarian, V.G., Arzakantsian, A.M., Danielian, V.Zh

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Investigation of diffraction parameters of real GaP crystals in a wide band of synchrotron radiation wavelengths von Karabekov, I.P., Egikian, D.L., Mikaelian, R.A., Arzakantsian, A.M.

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Measurements of diffraction parameters of Y3Al5O12 in a wide band of wavelenghts from 0.06 to 0.2 nm von Karabekov, I.P., Egikian, D.L., Mikaelian, R.A., Bagdasarian, V.G., Arzakantsian, A.M., Danielian, V.Zh

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Photoelectric and diffusion component measurements of germanium interference absorption coefficient von Karabekov, I.P., Egikian, D.L., Mikaelian, R.A., Bagdasarian, V.G.

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Predictive equations for leaf area and biomass for sugar bushes in eastern Ontario von Ter-Mikaelian, M, Lautenschlager, R.A

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