Combining standard addition and isotope dilution in order to improve SI traceable LA-ICP-MS measurements von Michaliszyn, Lena, Pramann, Axel, Röthke, Anita, Rienitz, Olaf

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A new method for the SI-traceable quantification of element contents in solid samples using LA-ICP-MS von Michaliszyn, Lena, Ren, Tongxiang, Röthke, Anita, Rienitz, Olaf

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Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE von D'Agostino, Giancarlo, Oelze, Marcus, Vogl, Jochen, Ghestem, Jean-Philippe, Lafaurie, Nicolas, Klein, Ole, Pröfrock, Daniel, Di Luzio, Marco, Bergamaschi, Luigi, Jaćimović, Radojko, Oster, Caroline, Irrgeher, Johanna, Lancaster, Shaun T., Walch, Anna, Röthke, Anita, Michaliszyn, Lena, Pramann, Axel, Rienitz, Olaf, Sara-Aho, Timo, Cankur, Oktay, Kutan, Derya, Noireaux, Johanna

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Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques von Lancaster, Shaun T., Sahlin, Eskil, Oelze, Marcus, Ostermann, Markus, Vogl, Jochen, Laperche, Valérie, Touze, Solène, Ghestem, Jean-Philippe, Dalencourt, Claire, Gendre, Régine, Stammeier, Jessica, Klein, Ole, Pröfrock, Daniel, Košarac, Gala, Jotanovic, Aida, Bergamaschi, Luigi, Di Luzio, Marco, D’Agostino, Giancarlo, Jaćimović, Radojko, Eberhard, Melissa, Feiner, Laura, Trimmel, Simone, Rachetti, Alessandra, Sara-Aho, Timo, Roethke, Anita, Michaliszyn, Lena, Pramann, Axel, Rienitz, Olaf, Irrgeher, Johanna

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