Conduction mechanisms at distinct resistive levels of Pt/TiO2-x/Pt memristors von Michalas, L., Stathopoulos, S., Khiat, A., Prodromakis, T.

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Electrical characteristics of interfacial barriers at metal-TiO2 contacts von Michalas, L, Khiat, A, Stathopoulos, S, Prodromakis, T

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An electrical characterisation methodology for identifying the switching mechanism in TiO2 memristive stacks von Michalas, L., Stathopoulos, S., Khiat, A., Prodromakis, T.

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Probing contactless injection dielectric charging in RF MEMS capacitive switches von Michalas, L, Koutsoureli, M, Papaioannou, G

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Electrical properties of nanostructured SiN films for MEMS capacitive switches von Koutsoureli, M, Xavier, S, Michalas, L, Lioutas, C, Bansropun, S, Papaioannou, G, Ziaei, A

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A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches von Koutsoureli, M., Michalas, L., Gantis, A., Papaioannou, G.

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Modeling and de-embedding the interferometric scanning microwave microscopy by means of dopant profile calibration von Michalas, L., Wang, F., Brillard, C., Chevalier, N., Hartmann, J. M., Marcelli, R., Theron, D.

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A study of field emission process in electrostatically actuated MEMS switches von Michalas, L., Garg, A., Venkattraman, A., Koutsoureli, M., Alexeenko, A., Peroulis, D., Papaioannou, G.

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Electrical assessment of diamond MIM capacitors and modeling of MEMS capacitive switch discharging von Michalas, L, Koutsoureli, M, Saada, S, Mer-Calfati, C, Leuliet, A, Martins, P, Bansropun, S, Papaioannou, G, Bergonzo, P, Ziaei, A

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Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches von Koutsoureli, M., Michalas, L., Papaioannou, G.

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Temperature dependence of the conduction mechanisms through a Pb(Zr,Ti)O3 thin film von Jégou, C., Michalas, L., Maroutian, T., Agnus, G., Koutsoureli, M., Papaioannou, G., Largeau, L., Troadec, D., Leuliet, A., Aubert, P., Lecoeur, Ph

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Comparative study of AlN dielectric films’ electrical properties for MEMS capacitive switches von Koutsoureli, M., Adikimenakis, A., Michalas, L., Papandreou, E., Stavrinidis, G., Konstantinidis, G., Georgakilas, A., Papaioannou, G.

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Properties of contactless and contacted charging in MEMS capacitive switches von Koutsoureli, M., Michalas, L., Martins, P., Papandreou, E., Leuliet, A., Bansropun, S., Papaioannou, G., Ziaei, A.

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Hot-wire substoichiometric tungsten oxide films deposited in hydrogen environment with n-type conductivity von Kostis, I, Michalas, L, Vasilopoulou, M, Konofaos, N, Papaioannou, G, Iliadis, A A, Kennou, S, Giannakopoulos, K, Papadimitropoulos, G, Davazoglou, D

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A temperature study of photosensitivity in SLS polycrystalline silicon TFTs von Michalas, L., Syntychaki, A., Koutsoureli, M., Papaioannou, G.J., Voutsas, A.T.

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Hydrogen passivation on Sequential Lateral Solidified poly-Si TFTs von Michalas, L., Koutsoureli, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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Electrical characteristics of interfacial barriers at metal—TiO 2 contacts von Michalas, L, Khiat, A, Stathopoulos, S, Prodromakis, T

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The effect of temperature on dielectric charging of capacitive MEMS von Koutsoureli, M, Michalas, L, Papaioannou, G

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Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress von Michalas, L., Papaioannou, G.J., Voutsas, A.T.

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Back gate influence on front channel operation of p-channel double gate polysilicon TFTs von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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