Resolving unknown inputs in mixed-level simulation with sequential elements von Meyassed, M., Klenke, R.H., Aylor, J.H.

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Measurement and modeling of the fast collapse of HgCdTe metal-insulator-semiconductor devices von MEYASSED, M, NEMIROVSKY, Y

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A 512 Mb NROM flash data storage memory with 8 MB/s data rate von Maayan, E., Dvir, R., Shor, J., Polansky, Y., Sofer, Y., Bloom, I., Avni, D., Eitan, B., Cohen, Z., Meyassed, M., Alpern, Y., Palm, H., v Kamienski, E.S., Haibach, P., Caspary, D., Riedel, S., Knofler, R.

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Interfaces for mixed-level simulation with sequential elements von Klenke, Robert H., Aylor, James H., Meyassed, Moshe, Dungan, William W.

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Integrated design environment for performance and dependability analysis von Klenke, Robert H, Meyassed, Moshe, Aylor, James H, Johnson, Barry W, Rao, Ramesh, Ghosh, Anup

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An Integrated Design Environment For Performance And Dependability Analysis von Klenke, R.H., Meyassed, M., Aylor, J.H., Johnson, B.W., Rae, R., Ghosh, A.

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Refinement of system-level designs using hybrid modeling von McGraw, R.M., Meyassed, M., Klenke, R.H., Aylor, J.H., Williams, R.D.

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Improvements to ADEPT-a VHDL based integrated design environment for performance and dependability analysis von Klenke, R.H., Aylor, J.H., Johnson, B.W., Choi, C.Y., Meyassed, M., Rao, R., Dungan, W.W.

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A 512Mb NROM flash data storage memory with 8MB/s data rate von Maayan, E., Ran Dvir, Shor, J., Yan Polansky, Sofer, Y., Bloom, I., Avni, D., Eitan, B., Cohen, Z., Meyassed, M., Alpern, Y., Palm, H., Stain v. Kamienski, E., Haibach, P., Caspary, D., Riedel, S., Knofler, R.

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