Collective effects in grain boundary migration von Merkle, K L, Thompson, L J, Phillipp, Fritz

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Atomic-scale observation of grain boundary motion von Merkle, K.L, Thompson, L.J

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Grain-boundary dissociation by the emission of stacking faults von Rittner, JD, Seidman, DN, Merkle, KL

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Substrate effects on the structure of epitaxial PbTiO3 thin films prepared on MgO, LaAlO3, and SrTiO3 by metalorganic chemical-vapor deposition von Foster, C. M., Li, Z., Buckett, M., Miller, D., Baldo, P. M., Rehn, L. E., Bai, G. R., Guo, D., You, H., Merkle, K. L.

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In-Situ HREM Studies of Grain Boundary Migration von Merkle, K.L., Thompson, L.J., Phillipp, F.

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High-Resolution Electron Microscopy of Twist and General Grain Boundaries von Merkle, K. L., Thompson, L. J.

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Atomic structure of grain boundaries von Merkle, Karl L.

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High-resolution electron microscopy of interfaces in fcc materials von Merkle, Karl L.

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The effect of microstructure on the electrical properties of YBCO interface-engineered Josephson junctions von Huang, Y., Merkle, K.L., Moeckly, B.H., Char, K.

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Atomic structure of symmetric tilt grain boundaries in NiO von MERKLE, K. L, SMITH, D. J

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Current transport along grain boundaries in d-wave superconductors von Carmody, M., Marks, L.D., Merkle, K.L.

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Quantification of atomic-scale grain boundary parameters by high-resolution electron microscopy von Merkle, Karl L.

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Chemistry and structure of CdO/Ag{222} heterophase interfaces von Chan, DK, Seidman, DN, Merkle, KL

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Determination of grain boundary volume expansion by HREM von Buckett, M.I., Merkle, K.L.

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Spatial variation of the current in grain boundary Josephson junctions von Carmody, M., Moeckly, B. H., Merkle, K. L., Marks, L. D.

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Geometric and electronic structure of epitaxial NbxTi1-xO2 on TiO2(110) von CHAMBERS, S. A, GAO, Y, KIM, Y. J, HENDERSON, M. A, THEVUTHASAN, S, WEN, S, MERKLE, K. L

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The effect of three‐fold astigmatism on measurements of grain boundary volume expansion by high‐resolution transmission electron microscopy von Merkle, K. L., Csencsits, R., Rynes, K. L., Withrow, J. P., Stadelmann, P. A.

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Determination of the current density distribution in Josephson junctions von Carmody, M, Landree, E, Marks, L.D, Merkle, K.L

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Structure and composition of grain boundary dislocation cores and stacking faults in MOCVD-grown YBa2Cu3O7-x thin films von GAO, Y, MERKLE, K. L, BAI, G, CHANG, H. L. M, LAM, D. J

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Interface-engineered YBCO edge junctions von Moeckly, B.H., Char, K., Huang, Yi, Merkie, K.L.

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