High-Resolution Electron Microscopy of Twist and General Grain Boundaries von Merkle, K. L., Thompson, L. J.

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Atomic structure of grain boundaries von Merkle, Karl L.

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High-resolution electron microscopy of interfaces in fcc materials von Merkle, Karl L.

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Quantification of atomic-scale grain boundary parameters by high-resolution electron microscopy von Merkle, Karl L.

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Interface microstructure and composition of a YBa2Cu3O7-x/N/YBa2Cu3O7-x SNS edge junction with CaRuO3 as the metallic barrier von ROZEVELD, S, MERKLE, K. L, CHAR, K

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Determination of grain boundary volume expansion by HREM von Buckett, M.I., Merkle, K.L.

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Chemistry and structure of CdO/Ag{222} heterophase interfaces von Chan, DK, Seidman, DN, Merkle, KL

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Damage effects of high energy electrons on metals von King, Wayne E., Benedek, R., Merkle, K.L., Meshii, M.

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Tilt grain boundaries in NiO von Merkle, K.L., Reddy, J.F., Wiley, C.L.

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Direct observation of spike effects in heavy-ion sputtering von Merkle, K. L., Jäger, W.

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Defect-cluster formation in high-energy-density cascades in gold von Jäger, W., Merkle, K. L.

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Collective effects in grain boundary migration von Merkle, K L, Thompson, L J, Phillipp, Fritz

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Quasi-periodic features in the atomic structure of long-period grain boundaries von Merkle, K L, Wolf, D

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Atomic-scale observation of grain boundary motion von Merkle, K.L, Thompson, L.J

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Correlations between ion and neutron irradiations: Defect production and stage I recovery von Averback, R.S, Benedek, R, Merkle, K.L

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Efficiency of defect production in cascades von Averback, R.S., Benedek, R., Merkle, K.L.

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Grain-boundary dissociation by the emission of stacking faults von Rittner, JD, Seidman, DN, Merkle, KL

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Atomic structure of heterophase interfaces von Merkle, K.L., Buckett, M.I., Gao, Y.

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Energy Dependence of Defect Production in Displacement Cascades in Silver von Merkle, K. L., Averback, R. S., Benedek, R.

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Electron microscopy of high- T c Josephson junctions formed in the epitaxial layer ramp-edge geometry: YBCO/barrier/YBCO von Merkle, K.L., Huang, Y., Rozeveld, S., Char, K., Moeckly, B.H.

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