Collective effects in grain boundary migration von Merkle, K L, Thompson, L J, Phillipp, Fritz

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Atomic-scale observation of grain boundary motion von Merkle, K.L, Thompson, L.J

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Substrate effects on the structure of epitaxial PbTiO3 thin films prepared on MgO, LaAlO3, and SrTiO3 by metalorganic chemical-vapor deposition von Foster, C. M., Li, Z., Buckett, M., Miller, D., Baldo, P. M., Rehn, L. E., Bai, G. R., Guo, D., You, H., Merkle, K. L.

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In-Situ HREM Studies of Grain Boundary Migration von Merkle, K.L., Thompson, L.J., Phillipp, F.

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Atomic structure of symmetric tilt grain boundaries in NiO von MERKLE, K. L, SMITH, D. J

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Determination of grain boundary volume expansion by HREM von Buckett, M.I., Merkle, K.L.

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The effect of microstructure on the electrical properties of YBCO interface-engineered Josephson junctions von Huang, Y., Merkle, K.L., Moeckly, B.H., Char, K.

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Geometric and electronic structure of epitaxial NbxTi1-xO2 on TiO2(110) von CHAMBERS, S. A, GAO, Y, KIM, Y. J, HENDERSON, M. A, THEVUTHASAN, S, WEN, S, MERKLE, K. L

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Current transport along grain boundaries in d-wave superconductors von Carmody, M., Marks, L.D., Merkle, K.L.

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Chemistry and structure of CdO/Ag{222} heterophase interfaces von Chan, DK, Seidman, DN, Merkle, KL

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The atomic structure of twin boundaries in rutile von Lee, W.-Y., Bristowe, P D, Gao, Y., Merkle, K L

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Grain-boundary dissociation by the emission of stacking faults von Rittner, JD, Seidman, DN, Merkle, KL

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The effect of three‐fold astigmatism on measurements of grain boundary volume expansion by high‐resolution transmission electron microscopy von Merkle, K. L., Csencsits, R., Rynes, K. L., Withrow, J. P., Stadelmann, P. A.

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Grain morphology and cation composition heterogeneity of Pb(ZrxTi1–x)O3 thin films deposited by metal-organic chemical vapor deposition von Tsu, I-Fei, Bai, G-R., Foster, C. M., Merkle, K. L., Liu, K. C.

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Determination of the current density distribution in Josephson junctions von Carmody, M, Landree, E, Marks, L.D, Merkle, K.L

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Trace analysis by heavy ion induced X-ray emission von ECKER, K. H, WEISE, H.-P, MERKLE, K. L

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Structure and composition of grain boundary dislocation cores and stacking faults in MOCVD-grown YBa2Cu3O7-x thin films von GAO, Y, MERKLE, K. L, BAI, G, CHANG, H. L. M, LAM, D. J

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High-Resolution Electron Microscopy of Twist and General Grain Boundaries von Merkle, K. L., Thompson, L. J.

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Interface microstructure and composition of a YBa2Cu3O7-x/N/YBa2Cu3O7-x SNS edge junction with CaRuO3 as the metallic barrier von ROZEVELD, S, MERKLE, K. L, CHAR, K

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High-Resolution Studies of Grain Boundary Structure in Yttria-Stabilized Cubic Zirconia Thin Films Grown by MOCVD von Merkle, K. L., Bai, G.-R., Li, Z., Song, C.-Y., Thompson, L. J.

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