Hot photocarrier dynamics in organic solar cells von Lane, P. A., Cunningham, P. D., Melinger, J. S., Esenturk, O., Heilweil, E. J.

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Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains von Cavrois, V.F., Pouget, V., McMorrow, D., Schwank, J.R., Fel, N., Essely, F., Flores, R.S., Paillet, P., Gaillardin, M., Kobayashi, D., Melinger, J.S., Duhamel, O., Dodd, P.E., Shaneyfelt, M.R.

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A Reagentless Biosensing Assembly Based on Quantum Dot-Donor Förster Resonance Energy Transfer von Medintz, I. L., Clapp, A. R., Melinger, J. S., Deschamps, J. R., Mattoussi, H.

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Laser Verification of Charge Sharing in a 90 nm Bulk CMOS Process von Amusan, O.A., Casey, M.C., Bhuva, B.L., McMorrow, D., Gadlage, M.J., Melinger, J.S., Massengill, L.W.

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Synthesis and Characterization of Donor−Acceptor Chromophores for Unidirectional Electron Transfer von Pepitone, M. F, Jernigan, G. G, Melinger, J. S, Kim, O.-K

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Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices von Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Torres, A., Gaillardin, M., Melinger, J.S., Knudson, A.R., Campbell, A.B., Schwank, J.R., Vizkelethy, G., Shaneyfelt, M.R., Hirose, K., Faynot, O., Jahan, C., Tosti, L.

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Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology von Balasubramanian, A., Amusan, O.A., Bhuva, B.L., Reed, R.A., Sternberg, A.L., Massengill, L.W., McMorrow, D., Nation, S.A., Melinger, J.S.

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New Insights Into Single Event Transient Propagation in Chains of Inverters-Evidence for Propagation-Induced Pulse Broadening von Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Fel, N., Baggio, J., Girard, S., Duhamel, O., Melinger, J.S., Gaillardin, M., Schwank, J.R., Dodd, P.E., Shaneyfelt, M.R., Felix, J.A.

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Two-Photon Excitation of Quantum-Dot-Based Fluorescence Resonance Energy Transfer and Its Applications von Clapp, A. R., Pons, T., Medintz, I. L., Delehanty, J. B., Melinger, J. S., Tiefenbrunn, T., Dawson, P. E., Fisher, B. R., O'Rourke, B., Mattoussi, H.

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A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS von Loveless, T.D., Massengill, L.W., Bhuva, B.L., Holman, W.T., Reed, R.A., McMorrow, D., Melinger, J.S., Jenkins, P.

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Processing of functional polymers and organic thin films by the matrix-assisted pulsed laser evaporation (MAPLE) technique von Piqué, A., Wu, P., Ringeisen, B.R., Bubb, D.M., Melinger, J.S., McGill, R.A., Chrisey, D.B.

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Generation of narrowband inversion with broadband laser pulses von MELINGER, J. S, GANDHI, S. R, HARIHARAN, A, TULL, J. X, WARREN, W. S

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Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies von Melinger, J.S., Buchner, S., McMorrow, D., Stapor, W.J., Weatherford, T.R., Campbell, A.B., Eisen, H.

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Subbandgap laser-induced single event effects: carrier generation via two-photon absorption von McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Pease, R.L.

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The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM von Warren, K.M., Weller, R.A., Mendenhall, M.H., Reed, R.A., Ball, D.R., Howe, C.L., Olson, B.D., Alles, M.L., Massengill, L.W., Schrimpf, R.D., Haddad, N.F., Doyle, S.E., McMorrow, D., Melinger, J.S., Lotshaw, W.T.

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A New Technique for SET Pulse Width Measurement in Chains of Inverters Using Pulsed Laser Irradiation von Ferlet-Cavrois, V., McMorrow, D., Kobayashi, D., Fel, N., Melinger, J.S., Schwank, J.R., Gaillardin, M., Pouget, V., Essely, F., Baggio, J., Girard, S., Flament, O., Paillet, P., Flores, R.S., Dodd, P.E., Shaneyfelt, M.R., Hirose, K., Saito, H.

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Three-dimensional mapping of single-event effects using two photon absorption von McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Boulghassoul, Y., Massengill, L.W., Pease, R.L.

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Demonstration of single-event effects induced by through-wafer two-photon absorption von McMorrow, D., Buchner, S., Lotshaw, W.T., Melinger, J.S., Maher, M., Savage, M.W.

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Analysis of the Transient Response of High Performance 50-nm Partially Depleted SOI Transistors Using a Laser Probing Technique von Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Melinger, J.S., Campbell, A.B., Gaillardin, M., Faynot, O., Thomas, O., Barna, G., Giffard, B.

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Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power von Casey, M.C., Armstrong, S.E., Arora, R., King, M.P., Ahlbin, J.R., Francis, S.A., Bhuva, B.L., McMorrow, D., Hughes, H.L., McMarr, P.J., Melinger, J.S., Massengill, L.W.

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