Compact Empirical Modeling of Nonlinear Dynamic Thermal Effects in Electron Devices von Melczarsky, I., Lonac, J.A., Filicori, F., Santarelli, A.

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Electrical measurement of the junction temperature and thermal resistance of HBTs von Melczarsky, I., Lonac, J.A., Filicori, F.

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Hybrid High Power Amplifiers for L-Band Space Application von Florian, C., Scappaviva, F., Paganelli, R.P., Melczarsky, I., Cignani, R., Pirazzini, M., Giordani, R., Feudale, M., Vannini, G., Filicori, F.

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On wafer multi-port linear characterization of passive structures using a standard 2-port VNA von Lonac, J A, Melczarsky, I, Paganelli, R P

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A simple technique for measuring the thermal impedance and the thermal resistance of HBTs von Lonac, J.A., Santarelli, A., Melczarsky, I., Filicori, F.

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Behavioral modeling and linearization of a mm-wave power amplifier von Melczarsky, I, Gilabert Pinal, Pere Lluís, Giacomo, Di V, Bertran Albertí, Eduardo, Filicori, F

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Simple method for characterizing linear multi-port microstrip structures von Lonac, Julio A., Melczarsky, Ilan, Paganelli, Rudi P.

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Behavioral modeling and linearization of a millimeter-wave power amplifier von Melczarsky, Ilan, Gilabert, Pere L., Di Giacomo, Valeria, Bertran, Eduard, Filicori, Fabio

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Contact resistance measurement techniques for Ag thick-film screen-printed contacts to solar cells von Melczarsky, M., Garcia, G.G., Posthuma, N.E., Van Kerschaver, E., Beaucarne, G.

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