Monte Carlo modeling of an integrating sphere reflectometer von Prokhorov, Alexander V, Mekhontsev, Sergey N, Hanssen, Leonard M

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Temperature-Resolved Infrared Spectral Emissivity of SiC and Pt–10Rh for Temperatures up to 900°C von Cagran, Claus P., Hanssen, Leonard M., Noorma, Mart, Gura, Alex V., Mekhontsev, Sergey N.

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Validation of the Infrared Emittance Characterization of Materials Through Intercomparison of Direct and Indirect Methods von Hanssen, Leonard M., Mekhontsev, Sergey N., Khromchenko, Vladimir B.

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Use of a High-Temperature Integrating Sphere Reflectometer for Surface-Temperature Measurements von Hanssen, Leonard M., Cagran, Claus P., Prokhorov, Alexander V., Mekhontsev, Sergey N., Khromchenko, Vladimir B.

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Radiative Properties of Blackbody Calibration Sources:Recent Advances in Computer Modeling von Prokhorov, Alexander V., Mekhontsev, Sergey N., Hanssen, Leonard M.

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Temperature-Resolved Infrared Spectral Emissivity of SiC and Pt-10Rh for Temperatures up to 900 deg C von Cagran, Claus P, Hanssen, Leonard M, Noorma, Mart, Gura, Alex V, Mekhontsev, Sergey N

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Infrared emittance measurements at NIST von Hanssen, L.M., Tsai, B.K., Mekhontsev, S.N.

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Status of NIST near infrared emittance measurement system von Hanssen, L.M., Rink, M., Mekhontsev, S.N.

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