A low-voltage, high-reflectance-change normally off refractive GaAs/Al/sub 0.2/Ga/sub 0.8/As MQW reflection modulator von Chih-Hsiang Lin, Meese, J.M., Yia-Chung Chang

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Smooth diamond films grown by hot filament chemical vapor deposition on positively biased silicon substrates von Chao, C.H., Popovici, G., Charlson, E.J., Charlson, E.M., Meese, J.M., Prelas, M.A.

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Oxygen displacement energy in ZnO von Meese, J.M, Locker, D.R

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Effect of mechanical stress on current-voltage characteristics of thin film polycrystalline diamond Schottky diodes von ZHAO, G, CHARLSON, E. M, CHARLSON, E. J, STACY, T, MEESE, J. M, POPOVICI, G, PRELAS, M

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Effect of GaAs/AlGaAs quantum-well structure on refractive index von Chih-Hsiang Lin, Meese, J.M., Wroge, M.L., Chun-Jen Weng

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Characterization and growth of SiC epilayers on Si substrates von Johnson, B.C., Meese, J.M., Zajac, G.W., Schreiner, J.O., Kaduk, J.A., Fleisch, T.H.

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Plasma etched polycrystalline hot-filament chemical vapor deposited diamond thin films and their electrical characteristics von Liaw, B. Y., Stacy, T., Zhao, G., Charlson, E. J., Charlson, E. M., Meese, J. M., Prelas, M. A.

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Processing of semiconductor materials and devices by neutron irradiation von Meese, J.M.

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Cluster center formation in neutron-damaged silicon von YOUSIF, H. N, COWAN, D. L, MEESE, J. M

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Zn Displacement Threshold in ZnTe von Meese, J.M.

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Deep level transient spectroscopy of neutron irradiated semiconductors von Farmer, J.W., Meese, J.M.

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Displacement Thresholds in ZnO von Locker, D. R., Meese, J. M.

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Photopumped laser operation of GaAs doping superlattices von VOJAK, B. A, ZAJAC, G. W, CHAMBERS, F. A, MEESE, J. M, CHUMBLEY, P. E, KALISKI, R. W, HOLONYAK, N. JR, NAM, D. W

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Raman scattering from amorphous zones in neutron irradiated silicon von Chandrasekhar, Meera, Chandrasekhar, H.R., Meese, J.M.

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Annealing mechanisms in neutron-irradiated silicon von Thaler, S.L., Chandrasekhar, H.R., Chandrasekhar, Meera, Meese, J.M.

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Effects of stellar particle irradiation on interstellar grains von Czyzak, S. J., Meese, J. M., Santiago, J. J.

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Photoconductivity null apparatus for the determination of minority carrier lifetime von Richardson, W. F., Meese, J. M., Westbrook, R. D.

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Room temperature electron damage in cds von Look, David C., Meese, J. M.

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Beam Scanner for a 1 MeV Van de Graaff von Carra, W. M., Ehret, J. E., Locker, D. R., Meese, J. M.

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Low Cost Beam Current Integrator von Carra, W. M., Ehret, J. E., Meese, J. M.

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