Assessing Influence in Regression Analysis with Censored Data von Escobar, Luis A., Meeker, William Q.

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Pitfalls of accelerated testing von Meeker, W.Q., Escobar, L.A.

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Physical model assisted probability of detection in nondestructive evaluation von Li, M., Meeker, W. Q., Thompson, R. B.

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Bayesian Methods for Accelerated Destructive Degradation Test Planning von Ying Shi, Meeker, W. Q.

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Statistical tools for the rapid development and evaluation of high-reliability products von Meeker, W.Q., Hamada, M.

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Analysis of Environmental Data with Censored Observations von Liu, Shiping, Lu, Jye-Chyi, Kolpin, Dana W, Meeker, William Q

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Accelerated Destructive Degradation Tests Robust to Distribution Misspecification von Shuen-Lin Jeng, Bei-Ying Huang, Meeker, W. Q.

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A failure-time model for infant-mortality and wearout failure modes von Chan, V., Meeker, W.Q.

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Accelerated Degradation Tests: Modeling and Analysis von Meeker, William Q., Escobar, Luis A., Lu, C. Joseph

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Estimating Fatigue Curves With the Random Fatigue-Limit Model von Pascual, Francis G., Meeker, William Q.

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Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests von Vander Wiel, S.A., Meeker, W.Q.

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Planning Life Tests in Which Units Are Inspected for Failure von Meeker, William Q.

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Optimum Accelerated Life Tests with a Nonconstant Scale Parameter von Meeter, Carol A., Meeker, William Q.

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Bayesian Methods for Planning Accelerated Life Tests von Zhang, Yao, Meeker, William Q

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The Nontruncated Marginal of a Truncated Bivariate Normal Distribution von Arnold, Barry C

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A Review of Recent Research and Current Issues in Accelerated Testing von Meeker, William Q., Escobar, Luis A.

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Using Degradation Measures to Estimate a Time-to-Failure Distribution von Lu, C. Joseph, Meeker, William O.

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Sample sizes for estimating the Weibull hazard function from censored samples von Meeker, W.Q., Escobar, L.A., Hill, D.A.

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The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles von Yili Hong, Meeker, W.Q., Escobar, L.A.

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Teaching about Approximate Confidence Regions Based on Maximum Likelihood Estimation von Meeker, William Q., Escobar, Luis A.

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