Effects of Channel Implant Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs von McLain, Michael L., Barnaby, Hugh J., Schlenvogt, Garrett

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Identification of localized radiation damage in power MOSFETs using EBIC imaging von Ashby, David S., Garland, Diana, Esposito, Madeline G., Vizkelethy, Gyorgy, Marinella, Matthew J., McLain, Michael, Llinás, J. P., Talin, A. Alec

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Play Directing: Analysis, Communication, and Style von Hodge, Francis, McLain, Michael

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Understanding the Implications of a LINAC's Microstructure on Devices and Photocurrent Models von McLain, Michael L., McDonald, J. Kyle, Hembree, Charles E., Sheridan, Timothy J., Weingartner, Thomas A., Dodd, Paul E., Shaneyfelt, Marty R., Hartman, Fred, Black, Dolores A.

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Total-ionizing-dose effects on isolation oxides in modern CMOS technologies von Barnaby, Hugh J., Mclain, Michael, Esqueda, Ivan Sanchez

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The susceptibility of TaOx-based memristors to high dose rate ionizing radiation and total ionizing dose von McLain, Michael Lee, Sheridan, Timothy J., Hjalmarson, Harold Paul, Mickel, Patrick R., Hanson, Donald J., McDonald, Joseph K., Hughart, David Russell, Marinella, Matthew J.

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Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides von Esqueda, I. S., Barnaby, H. J., Adell, P. C., Rax, B. G., Hjalmarson, H. P., McLain, M. L., Pease, R. L.

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Total ionizing dose effects in shallow trench isolation oxides von Faccio, Federico, Barnaby, Hugh J., Chen, Xiao J., Fleetwood, Daniel M., Gonella, Laura, McLain, Michael, Schrimpf, Ronald D.

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Effects of High Dose Rate Ionizing Radiation on Fused Silica and Sapphire Films von McLain, Michael L., Hartman, Fred, Zarick, Tom A., Hjalmarson, Harold P., Gleason, Joseph D., McDonald, Kyle, Sheridan, Tim J.

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Debris-flow avulsion tendency estimated from boreholes or channel cuts von McLain, Michael C., Santi, Paul M., Pyles, David R.

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The Susceptibility of }-Based Memristors to High Dose Rate Ionizing Radiation and Total Ionizing Dose von McLain, Michael L., Hjalmarson, Harold P., Sheridan, Tim J., Mickel, Patrick R., Hanson, Don, McDonald, Kyle, Hughart, David R., Marinella, Matthew J.

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THE PROFIT IN PROPRIETARY EDUCATION: AN EXPLORATORY EXAMINATION OF STUDENT LOAN RATES AND EARNINGS von Turner, Tiffanie, McLain, Michael

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Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in Memristors von Hughart, David R., Pacheco, Jose L., Lohn, Andrew J., Mickel, Patrick R., Bielejec, Edward, Vizkelethy, Gyorgy, Doyle, Barney L., Wolfley, Steven L., Dodd, Paul E., Shaneyfelt, Marty R., McLain, Michael L., Marinella, Matthew J.

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Effects of Channel Implant Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETs von Mclain, Michael L., Barnaby, Hugh, Schlenvogt, Garrett

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Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose von Esposito, Madeline G., Manuel, Jack E., Privat, Aymeric, Xiao, T. Patrick, Garland, Diana, Bielejec, Edward, Vizkelethy, Gyorgy, Dickerson, Jeramy, Brunhaver, John, Talin, A. Alec, Ashby, David, King, Michael P., Barnaby, Hugh, Mclain, Michael, Marinella, Matthew J.

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Modeling Ionizing Radiation Effects in Solid State Materials and CMOS Devices von Barnaby, H.J., McLain, M.L., Esqueda, I.S., Xiao Jie Chen

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Play Directing, 7th Edition von Francis Hodge, Michael McLain

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Multiscale System Modeling of Single-Event-Induced Faults in Advanced Node Processors von Cannon, Matthew, Rodrigues, Arun, Black, Dolores, Black, Jeff, Bustamante, Luis, Breeding, Matthew, Feinberg, Ben, Skoufis, Micahel, Quinn, Heather, Clark, Lawrence T., Brunhaver, John, Barnaby, Hugh, McLain, Michael, Agarwal, Sapan, Marinella, Matthew J.

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Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects von Taggart, J. L., Jacobs-Gedrim, R. B., McLain, M. L., Barnaby, H. J., Bielejec, E. S., Hardy, W., Marinella, M. J., Kozicki, M. N., Holbert, K.

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Study protocol for a randomized controlled trial of mindfulness-based relapse prevention for opioid use disorders von Zinzow, Heidi, Shi, Lu, Rennert, Lior, Chen, Liwei, Lopes, Snehal, Zhang, Lingling, Jones, Karyn, Jindal, Meenu, Stam, Claire, Mclain, Michael

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