The direct observation of grown-in laser scattering tomography defects in Czochralski silicon von NISHIMURA, M, YOSHINO, S, MOTOURA, H, SHIMURA, S, MCHEDLIDZE, T, HIKONE, T

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Electrical Activity of Defects Induced by Oxygen Precipitation in Czochralski-Grown Silicon Wafers von Mchedlidze, Teimouraz, Matsumoto, Kei, Asano, Eiichi

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N+P junction leakage current caused by oxygen precipitation defects and its temperature dependence von UCHIYAMA, H, MATSUMOTO, K, MCHEDLIDZE, T, NISIMURA, M, YAMABE, K

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Hall effect in anisotropic SixGe1-x polycrystals von MCHEDLIDZE, T. R, YONENAGA, I

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Hall Effect in Anisotropic Si x Ge 1-x Polycrystals von Yonenaga, Teimouraz R. Mchedlidze

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