“Making it work in the face of extreme adversity” - Exploring perceptions for the future of the imaging and oncology workforce using ‘soundbite’ interviews von Harcus, J., Ferrari, G., Berry, E., Cadogan, E., McNally, C.S., Bardwell, A., Singh, N., Beck, J.

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Macromolecular condensation buffers intracellular water potential von Watson, Joseph L., Seinkmane, Estere, Styles, Christine T., Mihut, Andrei, Krüger, Lara K., McNally, Kerrie E., Planelles-Herrero, Vicente Jose, Dudek, Michal, McCall, Patrick M., Barbiero, Silvia, Vanden Oever, Michael, Peak-Chew, Sew Yeu, Porebski, Benjamin T., Zeng, Aiwei, Rzechorzek, Nina M., Wong, David C. S., Beale, Andrew D., Stangherlin, Alessandra, Riggi, Margot, Iwasa, Janet, Morf, Jörg, Miliotis, Christos, Guna, Alina, Inglis, Alison J., Brugués, Jan, Voorhees, Rebecca M., Chambers, Joseph E., Meng, Qing-Jun, O’Neill, John S., Edgar, Rachel S., Derivery, Emmanuel

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Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages von Wong, C.S., Bennett, N.S., Manessis, D., Danilewsky, A., McNally, P.J.

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Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs von Bennett, N.S., Cherkaoui, K., Wong, C.S., O'Connor, É., Monaghan, S., Hurley, P., Chauhan, L., McNally, P.J.

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B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages von Cowley, A., Ivankovic, A., Wong, C.S., Bennett, N.S., Danilewsky, A.N., Gonzalez, M., Cherman, V., Vandevelde, B., De Wolf, I., McNally, P.J.

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Structural and optical properties of post-annealed atomic-layer-deposited HfO 2 thin films on GaAs von Bennett, N.S., Cherkaoui, K., Wong, C.S., O'Connor, É., Monaghan, S., Hurley, P., Chauhan, L., McNally, P.J.

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B-spline X-ray diffraction imaging - Rapid non-destructive measurement of die warpage in ball grid array packages von Cowley, A, Ivankovic, A, Wong, C.S, Bennett, N.S, Danilewsky, A.N, Gonzalez, M, Cherman, V, Vandevelde, B, De Wolf, Ingrid, McNally, P.J

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Multi-technique characterisation of MOVPE-grown GaAs on Si von Wong, C.S., Bennett, N.S., McNally, P.J., Galiana, B., Tejedor, P., Benedicto, M., Molina-Aldareguia, J.M., Monaghan, S., Hurley, P.K., Cherkaoui, K.

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