High-power terahertz radiation from relativistic electrons von Williams, G. P, Carr, G. L, Martin, Michael C, McKinney, Wayne R, Jordan, K, Neil, George R

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Development of in situ, at-wavelength metrology for soft X-ray nano-focusing von Yuan, Sheng, Yashchuk, Valeriy V., Goldberg, Kenneth A., Celestre, Richard, McKinney, Wayne R., Morrison, Gregory Y., Warwick, Tony, Padmore, Howard A.

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Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source von Yashchuk, Valeriy V., Lacey, Ian, Gevorkyan, Gevork S., McKinney, Wayne R., Smith, Brian V., Warwick, Tony

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IR spectroscopic characteristics of cell cycle and cell death probed by synchrotron radiation based Fourier transform IR spectromicroscopy von Holman, Hoi-Ying N., Martin, Michael C., Blakely, Eleanor A., Bjornstad, Kathy, Mckinney, Wayne R.

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Cross-check of ex-situ and in-situ metrology of a bendable temperature stabilized KB mirror von Yuan, Sheng, Goldberg, Kenneth A., Yashchuk, Valeriy V., Celestre, Richard, McKinney, Wayne R., Morrison, Gregory, Macdougall, James, Mochi, Iacopo, Warwick, Tony

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Diaboloidal mirrors: algebraic solution and surface shape approximations von Yashchuk, Valeriy V., Goldberg, Kenneth A., Lacey, Ian, McKinney, Wayne R., Sanchez del Rio, Manuel, Padmore, Howard A.

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Development of a high-performance gantry system for a new generation of optical slope measuring profilers von Assoufid, Lahsen, Brown, Nathan, Crews, Dan, Sullivan, Joseph, Erdmann, Mark, Qian, Jun, Jemian, Pete, Yashchuk, Valeriy V., Takacs, Peter Z., Artemiev, Nikolay A., Merthe, Daniel J., McKinney, Wayne R., Siewert, Frank, Zeschke, Thomas

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High precision tilt stage as a key element to a universal test mirror for characterization and calibration of slope measuring instruments von Yashchuk, Valeriy V., Artemiev, Nikolay A., Centers, Gary, Chaubard, Arthur, Geckeler, Ralf D., Lacey, Ian, Marth, Harry, McKinney, Wayne R., Noll, Tino, Siewert, Frank, Winter, Mathias, Zeschke, Thomas

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Development and calibration of mirrors and gratings for the soft x-ray materials science beamline at the Linac Coherent Light Source free-electron laser von Soufli, Regina, Fernández-Perea, Mónica, Baker, Sherry L, Robinson, Jeff C, Gullikson, Eric M, Heimann, Philip, Yashchuk, Valeriy V, McKinney, Wayne R, Schlotter, William F, Rowen, Michael

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Development of a new generation of optical slope measuring profiler von Yashchuk, Valeriy V., Takacs, Peter Z., McKinney, Wayne R., Assoufid, Lahsen, Siewert, Frank, Zeschke, Thomas

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Characterization of electron microscopes with binary pseudo-random multilayer test samples von Yashchuk, Valeriy V., Conley, Raymond, Anderson, Erik H., Barber, Samuel K., Bouet, Nathalie, McKinney, Wayne R., Takacs, Peter Z., Voronov, Dmitriy L.

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Binary pseudo-random gratings and arrays for calibration of modulation transfer functions of surface profilometers von Barber, Samuel K., Anderson, Erik D., Cambie, Rossana, McKinney, Wayne R., Takacs, Peter Z., Stover, John C., Voronov, Dmitriy L., Yashchuk, Valeriy V.

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Catalysis of PAH Biodegradation by Humic Acid Shown in Synchrotron Infrared Studies von Holman, Hoi-Ying N, Nieman, Karl, Sorensen, Darwin L, Miller, Charles D, Martin, Michael C, Borch, Thomas, McKinney, Wayne R, Sims, Ronald C

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Mid-infrared reflectivity of experimental atheromas von Holman, Hoi-Ying N, Bjornstad, Kathy A, Martin, Michael C, Mckinney, Wayne R, Blakely, Eleanor A, Blankenberg, Francis G

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Synchrotron infrared spectromicroscopy as a novel bioanalytical microprobe for individual living cells: cytotoxicity considerations von Holman, Hoi-Ying N, Bjornstad, Kathleen A, McNamara, Morgan P, Martin, Michael C, McKinney, Wayne R, Blakely, Eleanor A

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Surface roughness of stainless-steel mirrors for focusing soft x rays von Yashchuk, Valeriy V, Gullikson, Eric M, Howells, Malcolm R, Irick, Steve C, MacDowell, Alastair A, McKinney, Wayne R, Salmassi, Farhad, Warwick, Tony, Metz, James P, Tonnessen, Thomas W

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Low-Dose Responses to 2,3,7,8-Tetrachlorodibenzo-p-dioxin in Single Living Human Cells Measured by Synchrotron Infrared Spectromicroscopy von Holman, Hoi-Ying N, Goth-Goldstein, Regine, Martin, Michael C, Russell, Marion L, McKinney, Wayne R

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Design of Emission Spectrometers with Resolving Power of 10,000 von McKinney, Wayne R

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Elliptically Bent X-Ray Mirrors with Active Temperature Stabilization von Yuan, Sheng, Church, Matthew, Yashchuk, Valeriy V., Goldberg, Kenneth A., Celestre, Richard S., McKinney, Wayne R., Kirschman, Jonathan, Morrison, Gregory, Noll, Tino, Warwick, Tony, Padmore, Howard A.

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Ex situ metrology of x-ray diffraction gratings von Yashchuk, Valeriy V., McKinney, Wayne R., Artemiev, Nikolay A.

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