Surface Characterization von McGuire, G. E, Fuchs, J, Han, P, Kushmerick, J. G, Weiss, P. S, Simko, S. J, Nemanich, R. J, Chopra, D. R

Volltext

Resistance and structural stabilities of epitaxial CoSi2 films on (001) Si substrates von HSIA, S. L, TAN, T. Y, SMITH, P, MCGUIRE, G. E

Volltext

Formation of epitaxial CoSi2 films on (001) silicon using Ti-Co alloy and bimetal source materials von Hsia, S. L., Tan, T. Y., Smith, P., McGuire, G. E.

Volltext

Handbook of Compound Semiconductors - Growth, Processing, Characterization, and Devices von Holloway, Paul H, McGuire, Gary E

Volltext

Thermal stability of thin submicrometer lines of CoSi2 von WANG, Q. F, OSBURN, C. M, SMITH, P. L, CANOVAI, C. A, MCGUIRE, G. E

Volltext

Surface Characterization von McGuire, G. E, Weiss, P. S, Kushmerick, J. G, Johnson, J. A, Simko, Steve J, Nemanich, R. J, Parikh, Nalin R, Chopra, D. R

Volltext

Studies of film growth processes and surface structural characterization of ferroelectric memory-compatible SrBi2Ta2O9 layered perovskites via in   situ , real-time ion-beam analys... von Auciello, O., Krauss, A. R., Im, J., Gruen, D. M., Irene, E. A., Chang, R. P. H., McGuire, G. E.

Volltext

Surface Characterization von McGuire, G. E, Swanson, Max L, Parikh, Nalin R, Simko, Steve, Weiss, P. S, Ferris, J. H, Nemanich, R. J, Chopra, D. R, Chourasia, A. R

Volltext

Improved stability of thin cobalt disilicide films using BF2 implantation von WANG, Q. F, TSAI, J. Y, OSBURN, C. M, CHAPMAN, R, MCGUIRE, G. E

Volltext

Incorporation of metal silicides and refractory metals in VLSI technology von Osburn, C.M., Wang, Q.F., Kellam, M., Canovai, C., Smith, P.L., McGuire, G.E., Xiao, Z.G., Rozgonyi, G.A.

Volltext

Selective plasma deposition von Ray, M.A., Duarte, J., McGuire, G.E.

Volltext

Surface characterization von McGuire, G. E, Ray, M. A, Simko, Steven J, Perkins, F. Keith, Brandow, Susan L, Dobisz, Elizabeth A, Nemanich, R. J, Chourasia, A. R, Chopra, D. R

Volltext

Junction formation and poly-Si doping for scaled sub-micron CMOS technology von OSBURN, C. M, CHEVACHAROENKUL, S, MCGUIRE, G. E

Volltext

Low voltage electron emission from Pb(Zr x Ti1− x )O3-based thin film cathodes von Auciello, O., Ray, M. A., Palmer, D., Duarte, J., McGuire, G. E., Temple, D.

Volltext

Field emission device with back gated structure von Mammana, V. P., Jaeger, D., Shenderova, O., McGuire, G. E.

Volltext

High resistivity Co and Ti silicide formation on silicon-on-insulator substrates von HSIA, S. L, MCGUIRE, G. E, TAN, T. Y, SMITH, P. L, LYNCH, W. T

Volltext

Surface characterization von Ray, M. A, McGuire, G. E, Musselman, I. H, Nemanich, R. J, Chopra, D. R

Volltext

Laser ablation deposition of titanium nitride films on silicon substrates at room temperature von Auciello, O, Barnes, T, Chevacharoenkul, S, Schreiner, A.F, McGuire, G.E

Volltext

Factors affecting the quality of software project management: an empirical study based on the Capability Maturity Model von Mcguire, E. G.

Volltext

Surface characterization von Fulghum, J. E, McGuire, G. E, Musselman, I. H, Nemanich, R. J, White, J. M, Chopra, D. R, Chourasia, A. R

Volltext