Microstructure and piezoelectric response of Y Al1−N thin films von Mayrhofer, P.M., Riedl, H., Euchner, H., Stöger-Pollach, M., Mayrhofer, P.H., Bittner, A., Schmid, U.

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Microstructure and piezoelectric response of YxAl1−xN thin films von Mayrhofer, P.M., Riedl, H., Euchner, H., Stöger-Pollach, M., Mayrhofer, P.H., Bittner, A., Schmid, U.

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Circular test structure for the determination of piezoelectric constants of ScxAl1−xN thin films applying Laser Doppler Vibrometry and FEM simulations von Mayrhofer, P.M., Euchner, H., Bittner, A., Schmid, U.

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Impact of sputter deposition parameters on the microstructural and piezoelectric properties of CrxAl1−xN thin films von Wistrela, E., Schmied, I., Schneider, M., Gillinger, M., Mayrhofer, P.M., Bittner, A., Schmid, U.

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Circular test structure for the determination of piezoelectric constants of Sc x Al 1- x N thin films applying Laser Doppler Vibrometry and FEM simulations von Mayrhofer, P M, Euchner, H, Bittner, A, Schmid, U

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Precise Determination of d 33 and d 31 from Piezoelectric Deflection Measurements and 2D FEM Simulations Applied to Sc x Al 1-x N von Mayrhofer, P.M., Wistrela, E., Schneider, M., Bittner, A., Schmid, U.

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Circular Patterned Test Structures for Precise Determination of Piezoelectric Thin Film Constants: Application to ScxAl1-xN von Mayrhofer, P.M., Euchner, H., Bittner, A., Schmid, U.

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Large-scale synthesis of hematoregulatory nonapeptide SK&F 107647 by fragment coupling von Hiebl, J., Baumgartner, H., Bernwieser, I., Blanka, M., Bodenteich, M., Leitner, K., Rio, A., Rovenszky, F., Alberts, D.P., Bhatnagar, P.K., Banyard, A.F., Baresch, K., Esch, P.M., Kollmann, H., Mayrhofer, G., Weihtrager, H., Welz, W., Winkler, K., Chen, T., Patel, R., Lantos, I., Stevenson, D., Tubman, K.D., Undheim, K.

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