Comparison of Two Toric IOL Calculation Methods von Priglinger, S., Kampik, Anselm, Müller, M., Kortuem, Karsten U., Kern, C., Mayer, Wolfgang J.

Volltext

Investigation of coefficient of thermal expansion of silver thin film on different substrates using X-ray diffraction von Zoo, Yeongseok, Adams, Daniel, Mayer, J.W., Alford, T.L.

Volltext

Simulation Technology for Health Care Professional Skills Training and Assessment von Issenberg, S. Barry, McGaghie, William C, Hart, Ian R, Mayer, Joan W, Felner, Joel M, Petrusa, Emil R, Waugh, Robert A, Brown, Donald D, Safford, Robert R, Gessner, Ira H, Gordon, David Lee, Ewy, Gordon A

Volltext

Modern Corneal Eye-Banking Using a Software-Based IT Management Solution von Mayer, Wolfgang J., Dirisamer, M., Nilmayer, O., Wertheimer, C., Kortuem, Karsten U., Kern, C., Priglinger, Siegfried G.

Volltext

Characterization of the physical and electrical properties of Indium tin oxide on polyethylene napthalate von Han, H., Adams, Daniel, Mayer, J. W., Alford, T. L.

Volltext

Physical mechanisms behind the ion-cut in hydrogen implanted silicon von Höchbauer, T., Misra, A., Nastasi, M., Mayer, J. W.

Volltext

Band gap shift in the indium-tin-oxide films on polyethylene napthalate after thermal annealing in air von Han, H., Mayer, J. W., Alford, T. L.

Volltext

Effect of substrate patterning on hydroxyapatite sol–gel thin film growth von Mudenda, S., Streib, K.L., Adams, D., Mayer, J.W., Nemutudi, R., Alford, T.L.

Volltext

Comparing refractive outcomes of a standard industry toric IOL calculator using anterior corneal astigmatism and total corneal refractive power von Kern, C., El Kaissi, L., Kortuem, K., Shajari, M., Vounotrypidis, E., Langenbucher, A., Priglinger, S., Mayer, W. J.

Volltext

Spironolactone in the treatment of central serous chorioretinopathy – a case series von Herold, T. R., Prause, K., Wolf, A., Mayer, W. J., Ulbig, M. W.

Volltext

Ion beam mixing in metallic and semiconductor materials von Nastasi, M., Mayer, J.W.

Volltext

Ion beams in silicon processing and characterization von Chason, E., Picraux, S. T., Poate, J. M., Borland, J. O., Current, M. I., Diaz de la Rubia, T., Eaglesham, D. J., Holland, O. W., Law, M. E., Magee, C. W., Mayer, J. W., Melngailis, J., Tasch, A. F.

Volltext

Twelve-month experience with Ozurdex for the treatment of macular edema associated with retinal vein occlusion von Mayer, W J, Wolf, A, Kernt, M, Kook, D, Kampik, A, Ulbig, M, Haritoglou, C

Volltext

Oxidation and protection in copper and copper alloy thin films von LI, J, MAYER, J. W, COLGAN, E. G

Volltext

Dopant activation in ion implanted silicon by microwave annealing von Alford, T. L., Thompson, D. C., Mayer, J. W., Theodore, N. David

Volltext

Investigation of thermal stability, phase formation, electrical, and microstructural properties of sputter-deposited titanium aluminide thin films von Kim, H.C., Theodore, N.D., Gadre, K.S., Mayer, J.W., Alford, T.L.

Volltext

Plasma hydrogenation of strained Si ∕ SiGe ∕ Si heterostructure for layer transfer without ion implantation von Shao, Lin, Lin, Yuan, Lee, J. K., Jia, Q. X., Wang, Yongqiang, Nastasi, M., Thompson, Phillip E., Theodore, N. David, Chu, Paul K., Alford, T. L., Mayer, J. W., Chen, Peng, Lau, S. S.

Volltext

Effect of various annealing environments on electrical and optical properties of indium tin oxide on polyethylene napthalate von Han, H., Mayer, J. W., Alford, T. L.

Volltext

Investigation of the cut location in hydrogen implantation induced silicon surface layer exfoliation von Höchbauer, T., Misra, A., Nastasi, M., Mayer, J. W.

Volltext

Effects of hydrogen implantation temperature on ion-cut of silicon von Lee, J. K., Nastasi, M., Theodore, N. David, Smalley, A., Alford, T. L., Mayer, J. W., Cai, M., Lau, S. S.

Volltext