Correlation of the ionisation response at selected points of IC sensitive regions with SEE sensitivity parameters under pulsed laser irradiation von Gordienko, A.V., Mavritskii, O.B., Egorov, A.N., Pechenkin, A.A., Savchenkov, D.V.

Volltext

NIR Microscopy Possibilities for the Visualization of Silicon Microelectronic Structure Topology through the Substrate von Mavritskii, O.B., Egorov, A.N., Nastulyavichus, A.A., Pechenkin, A.A., Smirnov, N.A., Chumakov, A.I.

Volltext