Coalescence aspects of III-nitride epitaxy von Lebedev, V., Tonisch, K., Niebelschütz, F., Cimalla, V., Cengher, D., Cimalla, I., Mauder, Ch, Hauguth, S., Ambacher, O., Morales, F. M., Lozano, J. G., González, D.

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Surface composition and electronic properties of indium tin oxide and oxynitride films von Himmerlich, M., Koufaki, M., Mauder, Ch, Ecke, G., Cimalla, V., Schaefer, J.A., Aperathitis, E., Krischok, S.

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Effect of island coalescence on structural and electrical properties of InN thin films von Lebedev, V., Cimalla, V., Morales, F.M., Lozano, J.G., González, D., Mauder, Ch, Ambacher, O.

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Novel III-nitride based transparent photodetectors for standing wave interferometry von Hauguth, S., Lebedev, V., Mauder, Ch, Niebelschütz, F., Büchner, H.-J., Jäger, G., Ambacher, O.

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Performance and Reliability Issues of SiC-Schottky Diodes von Griebl, Erich, Treu, Michael, Bartsch, Wolfgang, Rupp, Roland, Mauder, Anton, Werner, Wolfgang, Stephani, Dietrich

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New variations in the colloidal route to ErIII@ZnO nanocrystals and films von KUHN, Ch. H, LIPSKI, R, SEELER, F, MAUDER, D, MÜLLER, G, SPANHEL, L

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