Investigation of defect generation and annihilation in IGZO TFTs during practical stress conditions: illumination and electrical bias von Vemuri, Rajitha N P, Mathews, Winnie P, Marrs, Michael, Alford, T L

Volltext

Influence of Extended Bias Stress on the Electrical Parameters of Mixed Oxide Thin Film Transistors von Mathews, Winnie P., Vemuri, Rajitha N. P., Alford, Terry L.

Volltext

Mixed Oxide Thin Film Transistors under Combinatory Optical Irradiation and Electrical Bias von Alford, Terry L, Vemuri, Rajitha N. P., Mathews, Winnie P.

Volltext

Mixed Oxide Thin Film Transistors Under Combinatory Optical Irradiation and Electrical Bias von Alford, Terry L., Vemuri, Rajitha N. P., Mathews, Winnie P.

Volltext

Goniometer-based femtosecond crystallography with X-ray free electron lasers von Cohen, Aina E., Soltis, S. Michael, González, Ana, Aguila, Laura, Alonso-Mori, Roberto, Barnes, Christopher O., Baxter, Elizabeth L., Brehmer, Winnie, Brewster, Aaron S., Brunger, Axel T., Calero, Guillermo, Chang, Joseph F., Chollet, Matthieu, Ehrensberger, Paul, Eriksson, Thomas L., Feng, Yiping, Hattne, Johan, Hedman, Britt, Hollenbeck, Michael, Holton, James M., Keable, Stephen, Kobilka, Brian K., Kovaleva, Elena G., Kruse, Andrew C., Lemke, Henrik T., Lin, Guowu, Lyubimov, Artem Y., Manglik, Aashish, Mathews, Irimpan I., McPhillips, Scott E., Nelson, Silke, Peters, John W., Sauter, Nicholas K., Smith, Clyde A., Song, Jinhu, Stevenson, Hilary P., Tsai, Yingssu, Uervirojnangkoorn, Monarin, Vinetsky, Vladimir, Wakatsuki, Soichi, Weis, William I., Zadvornyy, Oleg A., Zeldin, Oliver B., Zhu, Diling, Hodgson, Keith O.

Volltext

Goniometer-based femtosecond crystallography with X-ray free electron lasers von Cohen, Aina E., Soltis, S. Michael, González, Ana, Aguila, Laura, Alonso-Mori, Roberto, Barnes, Christopher O., Baxter, Elizabeth L., Brehmer, Winnie, Brewster, Aaron S., Brunger, Axel T., Calero, Guillermo, Chang, Joseph F., Chollet, Matthieu, Ehrensberger, Paul, Eriksson, Thomas L., Feng, Yiping, Hattne, Johan, Hedman, Britt, Hollenbeck, Michael, Holton, James M., Keable, Stephen, Kobilka, Brian K., Kovaleva, Elena G., Kruse, Andrew C., Lemke, Henrik T., Lin, Guowu, Lyubimov, Artem Y., Manglik, Aashish, Mathews, Irimpan I., McPhillips, Scott E., Nelson, Silke, Peters, John W., Sauter, Nicholas K., Smith, Clyde A., Song, Jinhu, Stevenson, Hilary P., Tsai, Yingssu, Uervirojnangkoorn, Monarin, Vinetsky, Vladimir, Wakatsuki, Soichi, Weis, William I., Zadvornyy, Oleg A., Zeldin, Oliver B., Zhu, Diling, Hodgson, Keith O.

Volltext

Goniometer-based femtosecond crystallography with X-ray free electron lasers von Cohen, Aina E., Soltis, S. Michael, González, Ana, Aguila, Laura, Alonso-Mori, Roberto, Barnes, Christopher O., Baxter, Elizabeth L., Brehmer, Winnie, Brewster, Aaron S., Brunger, Axel T., Calero, Guillermo, Chang, Joseph F., Chollet, Matthieu, Ehrensberger, Paul, Eriksson, Thomas L., Feng, Yiping, Hattne, Johan, Hedman, Britt, Hollenbeck, Michael, Holton, James M., Keable, Stephen, Kobilka, Brian K., Kovaleva, Elena G., Kruse, Andrew C., Lemke, Henrik T., Lin, Guowu, Lyubimov, Artem Y., Manglik, Aashish, Mathews, Irimpan I., McPhillips, Scott E., Nelson, Silke, Peters, John W., Sauter, Nicholas K., Smith, Clyde A., Song, Jinhu, Stevenson, Hilary P., Tsai, Yingssu, Uervirojnangkoorn, Monarin, Vinetsky, Vladimir, Wakatsuki, Soichi, Weis, William I., Zadvornyy, Oleg A., Zeldin, Oliver B., Zhu, Diling, Hodgson, Keith O.

Volltext