Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors von Konvalina, Ivo, Paták, Aleš, Zouhar, Martin, Müllerová, Ilona, Fořt, Tomáš, Unčovský, Marek, Materna Mikmeková, Eliška

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Methods of the electron induced cleanning in SEM von Müllerová, Ilona, Konvalina, Ivo, Materna Mikmeková, Eliška

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Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Průcha, Lukáš, Piňos, Jakub, Müllerová, Ilona, Materna Mikmeková, Eliška

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Applications of Low and Ultra-low Energy Scanning Electron Microscopy von Müllerová, Ilona, Frank, Luděk, Mikmeková, Šárka, Materna Mikmeková, Eliška

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Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy von Materna Mikmeková, Eliška, Frank, Luděk, Konvalina, Ivo, Müllerová, Ilona, Zhang, Tao, Asefa, Tewodros

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The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements von Konvalina, Ivo, Zouhar, Martin, Daniel, Benjamin, Paták, Aleš, Piňos, Jakub, Frank, Luděk, Müllerová, Ilona, Mikmeková, Eliška Materna

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Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Piňos, Jakub, Radlička, Tomáš, Frank, Luděk, Müllerová, Ilona, Materna Mikmeková, Eliška

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In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM von Konvalina, Ivo, Mika, Filip, Krátký, Stanislav, Materna Mikmeková, Eliška, Müllerová, Ilona

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Deep Learning-Powered Optical Microscopy for Steel Research von Mikmeková, Šárka, Zouhar, Martin, Čermák, Jan, Ambrož, Ondřej, Jozefovič, Patrik, Konvalina, Ivo, Materna Mikmeková, Eliška, Materna, Jiří

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A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning von Materna Mikmeková, Eliška, Materna, Jiří, Konvalina, Ivo, Mikmeková, Šárka, Müllerová, Ilona, Asefa, Tewodros

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Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Müllerová, Ilona, Frank, Luděk, Piňos, Jakub, Průcha, Lukáš, Radlička, Tomáš, Werner, Wolfgang S M, Mikmeková, Eliška Materna

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2aB_SS2-3Prospects of Scanning Low Energy Electron Microscopy in Material Science von Müllerová, Ilona, Mikmeková, Šárka, Materna-Mikmeková, Eliška, Frank, Luděk, Matsuda, Kenji

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Very Low Energy Electron Transmission Spectroscopy of 2D Materials von Konvalina, Ivo, Daniel, Benjamin, Zouhar, Martin, Paták, Aleš, Piňos, Jakub, Radlička, Tomáš, Frank, Luděk, Müllerová, Ilona, Materna-Mikmeková, Eliška

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In-situ thermal Raman spectroscopy of single-layer graphene on different substrates von Průcha, Lukáš, Lejeune, Michael, Kizovský, Martin, Materna-Mikmeková, Eliška

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Imaging Ferroelectric Nanodomains in Strained BiFeO 3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices von Ma, Haili, Mikmeková, Šárka, Konvalina, Ivo, Yin, Xiaozhe, Sun, Fei, Piňos, Jakub, Vaškovicová, Naděžda, Průcha, Lukáš, Müllerová, Ilona, Mikmeková, Eliška Materna, Chen, Deyang

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Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons von Mikmekova, Eliska Materna, Konvalina, Ivo, Mullerova, Ilona, Lejeune, Michael, Asefa, Tewodros

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Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices von Ma, Haili, Mikmeková, Šárka, Konvalina, Ivo, Yin, Xiaozhe, Sun, Fei, Piňos, Jakub, Vaškovicová, Naděžda, Průcha, Lukáš, Müllerová, Ilona, Mikmeková, Eliška Materna, Chen, Deyang

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TITANIUM DIOXIDE PARTICLES AND METHODS OF MAKING THE SAME von MIKMEKOVÁ, Eliška Materna, ASEFA, Tewodros, ZHANG, Tao, TYRYSHKIN, Alexei M

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TITANIUM DIOXIDE PARTICLES AND METHODS OF MAKING THE SAME von Zhang, Tao, Mikmeková, Eliska Materna, Tyryshkin, Alexei M, Asefa, Tewodros

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