The use of X‐ray absorption spectroscopy for monitoring the thickness of antiwear films from ZDDP von ML Suominen Fuller, L Rodriguez Fernandez, Massoumi, G R, Lennard, W N, Kasrai, M, Bancroft, G M

Volltext

Film thickness measurements of SiO2 by XPS von Mitchell, D. F., Clark, K. B., Bardwell, J. A., Lennard, W. N., Massoumi, G. R., Mitchell, I. V.

Volltext

Positron and electron backscattering from solids von MASSOUMI, G. R, HOZHABRI, N, JENSEN, K. O, LENNARD, W. N, LORENZO, M. S, SCHULTZ, P. J, WALKER, A. B

Volltext

SPIX : a new technique for quantitative surface spectroscopy applied to S/InP(001) von RODRIGUEZ-FERNANDEZ, L, LENNARD, W. N, XIA, H, MASSOUMI, G. R

Volltext

Positron beam study of annealed silicon nitride films von Landheer, D., Aers, G. C., Sproule, G. I., Lawther, D. W., Simpson, P. J., Massoumi, G. R., Tong, S. Y.

Volltext

Absolute coverage measurements on sulphur-passivated GaAs(100) von Xia, H., Lennard, W.N., Massoumi, G.R., van Eck, J.J.J., Huang, L.J., Lau, W.M., Landheer, D.

Volltext

Energy loss measurements for 20 keV positrons in Al thin films von Massoumi, G.R., Lennard, W.N., Schultz, Peter J., Porcelli, T.A., Simpson, P.J.

Volltext

Absolute determination of saturated ethylene coverage on Pt(111) von Mitchell, I.V., Lennard, W.N., Griffiths, K., Massoumi, G.R., Huppertz, J.W.

Volltext

Rare gas moderated electrostatic positron beam von Massoumi, G. R., Hozhabri, N., Lennard, W. N., Schultz, P. J., Baert, S. F., Jorch, H. H., Weiss, A. H.

Volltext

Observation of the difference between e--e- and e+-e- interactions von LENNARD, W. N, SCHULTZ, P. J, MASSOUMI, G. R, LOGAN, L. R

Volltext

Characterization of silicon oxynitride films using ion beam analysis techniques von Walker, S.R, Davies, J.A, Mascher, P, Wallace, S.G, Lennard, W.N, Massoumi, G.R, Elliman, R.G, Ophel, T.R, Timmers, H

Volltext

An alternative technique for oxygen surface coverage measurements von Lennard, W.N., Tong, S.Y., Mitchell, I.V., Massoumi, G.R.

Volltext

Ion channeling analysis of a Si1-xGex(As)/Si strained layer von MOORE, J. A, LENNARD, W. N, MASSOUMI, G. R, JACKMAN, T. E, BARIBEAU, J.-M, JACKMAN, J. A

Volltext

Absolute coverage measurement of a NaCl layer on InP(001) using SPIX von Xia, H., Lennard, W.N., Rodríguez-Fernández, L., Massoumi, G.R.

Volltext

Electron and positron backscattering in the medium-energy range von MASSOUMI, G. R, LENNARD, W. N, SCHULTZ, P. J, WALKER, A. B, JENSEN, K. O

Volltext

Stopping Powers for Positrons and Electrons von Lennard, WN, Massoumi, GR, Schultz, PJ, Simpson, PJ, Aers, GC

Volltext

Anomalous pulse heights in silicon detectors von Lennard, W.N., Massoumi, G.R.

Volltext

Measurements of thin oxide films of SiO2/Si(100) von Lennard, W.N., Massoumi, G.R., Mitchell, I.V., Tang, H.T., Mitchell, D.F., Bardwell, J.A.

Volltext

Doubly differential positron-backscattering yields von MASSOUMI, G. R, HOZHABRI, N, LENNARD, W. N, SCHULTZ, P. J

Volltext

Deuterium depth distribution investigations in Zr and ZrO2 von Lennard, W.N., Massoumi, G.R., Alkemade, P.F.A., Mitchell, I.V., McIntyre, N.S., Davidson, R.D.

Volltext