Cation Ordering Types and Dielectric Properties in the Complex Perovskite Ca(Ca1/3Nb2/3)O3 von Levin, I., Chan, J.Y., Geyer, R.G., Maslar, J.E., Vanderah, T.A.

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In situ Raman spectroscopic investigation of zirconium–niobium alloy corrosion under hydrothermal conditions von Maslar, J.E, Hurst, W.S, Bowers, W.J, Hendricks, J.H

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Alloy 600 Aqueous Corrosion at Elevated Temperatures and Pressures: An In Situ Raman Spectroscopic Investigation von Maslar, J. E., Hurst, W. S., Bowers, W. J., Hendricks, J. H., Windsor, E. S.

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In situ Raman spectroscopic investigation of chromium surfaces under hydrothermal conditions von Maslar, J.E, Hurst, W.S, Bowers, W.J, Hendricks, J.H, Aquino, M.I, Levin, I

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In Situ Gas-Phase Diagnostics for Titanium Nitride Atomic Layer Deposition von Maslar, James E., Kimes, William, Sperling, Brent

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Optical flow cell and apparatus for solubility, salt deposition and Raman spectroscopic studies in aqueous solutions near the water critical point von Hurst, W.S, Hodes, M.S, Bowers, W.J, Bean, V.E, Maslar, J.E, Griffith, P, Smith, K.A

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Atomic Layer Deposition - Process Models and Metrologies von Burgess, D.R. Jr, Maslar, J.E., Hurst, W.S., Moore, E.F., Kimes, W.A., Fink, R.R., Nguyen, N.V.

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In situ Raman spectroscopic characterization of compound semiconductor free carrier concentration von Maslar, J.E., Wang, C.A., Oakley, D.C.

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In situ gas phase infrared absorption measurements during hafnium oxide atomic layer deposition von Maslar, J.E., Hurst, W.S., Burgess, D.R., Kimes, W.A., Nguyen, N.V., Moore, E.F.

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Silicon nanowire memory application using hafnium oxide charge storage layer von Xiaoxiao Zhu, Qiliang Li, Ioannou, D.E., Kimes, W.A., Suehle, J.S., Maslar, J.E., Xiong, H.D., Shuo Yang, Richter, C.A.

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