Integrated Analysis of Computer and Physical Experiments von Reese, C. Shane, Wilson, Alyson G, Hamada, Michael, Martz, Harry F, Ryan, Kenneth J

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Bayesian Reliability von Hamada, Michael S, Martz, Harry F, Reese, C. Shane, Wilson, Alyson G

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Empirical Bayes Estimation of the Reliability of Nuclear-Power-Plant Emergency Diesel Generators von Martz, Harry F., Kvam, Paul H., Abramson, Lee R.

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A Distribution-Free Bayesian Approach for Determining the Joint Probability of Failure of Materials Subject to Multiple Proof Loads von Umble, Elisabeth J., Seaman, John W., Martz, Harry F.

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Optimizing the product-based availability of a buffered industrial process von Hamada, Michael, Martz, Harry F., Berg, Eric C., Koehler, Arthur J.

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Uncertainty in counts and operating time in estimating Poisson occurrence rates von Martz, Harry F., Hamada, Michael S.

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Optimizing the product-based availability of a buffered industrial process: Genetic algorithms and reliability von HAMADA, Michael, MARTZ, Harry F, BERG, Eric C, KOEHLER, Arthur J

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Risk Analysis of Terrorist Attacks von Martz, Harry F., Johnson, Mark E.

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Reliability Concepts

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Bayes reliability estimation using multiple sources of prior information: binomial sampling von Savchuk, V.P., Martz, H.F.

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Discussion von Johnson, Valen E., Fitzgerald, Mark, Martz, Harry F.

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[Estimating Fatigue Curves with the Random Fatigue-Limit Model]: Discussion von Johnson, Valen E., Fitzgerald, Mark, Martz, Harry F.

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Discussion von Johnson, Valen E., Fitzgerald, Mark, Martz, Harry F.

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[Estimating Fatigue Curves with the Random Fatigue-Limit Model]: Discussion von Johnson, Valen E., Fitzgerald, Mark, Martz, Harry F.

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Estimation of trends in the scam rate at nuclear power plants von Martz, Harry F, Parker, Robert L, Rasmuson, Dale M

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On comparing PRA results with operating experience von Martz, Harry F., Picard, Richard R.

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Estimation of Trends in the Scram Rate at Nuclear Power Plants von Martz, Harry F., Parker, Robert L., Rasmuson, Dale M.

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Using higher-level failure data in fault tree quantification von Martz, Harry F., Almond, Russell G.

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Detecting trends and patterns in reliability data over time using exponentially weighted moving-averages von Martz, Harry F., Kvam, Paul H.

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BAYESIAN SINGLE-LEVEL BINOMIAL AND EXPONENTIAL RELIABILITY DEMONSTRATION TEST PLANS von FITZGERALD, MARK, MARTZ, HARRY F., PARKER, ROBERT L.

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