Surface energy of a magnetic recording disk: influence of the carbon overcoat composition von Leezenberg, P.B., Martner, C.C., Hermsmeier, B.D., Crowder, M.S.

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Shallow angle cut along a longitudinal direction of a feature in a semiconductor wafer von MARTNER CECILIA C, BORDEN PETER G

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Electronic spectroscopy of molecular ions by velocity modulation with cw dye lasers: a non-intrusive, in situ state-selective probe of plasma dynamics von Gudeman, Christopher S., Martner, Cecilia C., Saykally, Richard J.

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Radiative lifetimes of trapped molecular ions: HCl+ and HBr von Martner, Cecilia C., Pfaff, Jürgen, Rosenbaum, Neil H., O’Keefe, Anthony, Saykally, Richard J.

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Valganciclovir in Patients with Glioblastoma von Hellstrand, Kristoffer, Martner, Anna, Bergström, Tomas, Söderberg-Nauclér, Cecilia, Peredo, Inti, Stragliotto, Giuseppe

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Method and apparatus for measuring thickness of a test object between two eddy current sensor heads von LEI LAWRENCE C.,LU SIQING,CHANG YU,MARTNER CECILIA,PHAM QUYEN,GU YU PING,HUSTON JOEL,SMITH PAUL,MILLER G. LAURIE

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Evolution of the corrosion process on thin-film media von Ying, JiFeng, Anoikin, Tatiana, Martner, Cecilia

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Method and apparatus for measuring a thickness of a layer of a wafer von Lei, Lawrence C, Lu, Siqing, Chang, Yu, Martner, Cecilia, Pham, Quyen, Gu, Yu Ping, Huston, Joel, Smith, Paul, Miller, Gabriel Lorimer

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Method and apparatus for measuring a thickness of a layer of a wafer von CHANG YU, MILLER GABRIEL LORIMER, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, LU SIQING, GU YU PING, SMITH PAUL

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Apparatus and method of dynamically measuring thickness of a layer of a substrate von Lei, Lawrence C, Lu, Siqing, Chang, Yu, Martner, Cecilia, Pham, Quyen, Gu, Yu P, Huston, Joel, Smith, Paul, Miller, G. Lorimer

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METHOD AND APPARATUS FOR MEASURING OBJECT THICKNESS von CHANG YU, MILLER GABRIEL LORIMER, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, LU SIQING, GU YU PING, SMITH PAUL

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Method and apparatus for dynamically measuring the thickness of an object von Lei, Lawrence C, Lu, Siqing, Chang, Yu, Martner, Cecilia, Pham, Quyen, Gu, Yu Ping, Huston, Joel, Smith, Paul, Miller, Gabriel Lorimer

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Apparatus and method of dynamically measuring thickness of a layer of a substrate von MILLER G. LORIMER, CHANG YU, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, LU SIQING, GU YU P, SMITH PAUL

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Method and apparatus for measuring object thickness von CHANG YU, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, LU SIQING, GU YU P, SMITH PAUL, MILLER GABRIEL L

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Method and apparatus for dynamically measuring the thickness of an object von CHANG YU, MILLER GABRIEL LORIMER, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, LU SIQING, GU YU PING, SMITH PAUL

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METHOD AND APPARATUS FOR MEASURING THICKNESS OF A TEST OBJECT BETWEEN TWO EDDY CURRENT SENSOR HEADS von CHANG YU, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, MILLER G. LAURIE, LU SIQING, GU YU PING, SMITH PAUL

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Method and apparatus for measuring object thickness von CHANG YU, MILLER GABRIEL LORIMER, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, LU SIQING, GU YU PING, SMITH PAUL

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METHOD AND APPARATUS FOR MEASURING THICKNESS OF A TEST OBJECT BETWEEN TWO EDDY CURRENT SENSOR HEADS von QUYEN PHAM, CECILIA MARTNER, PAUL SMITH, LAWRENCE, C. LEI, YU CHANG, JOEL HUSTON, SIQING LU, YU, PING GU, G., LAURIE MILLER

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METHOD AND APPARATUS FOR MEASURING THICKNESS OF A TEST OBJECT BETWEEN TWO EDDY CURRENT SENSOR HEADS von CHANG, YU, HUSTON, JOEL, MARTNER, CECILIA, LEI, LAWRENCE, C, MILLER, G., LAURIE, LU, SIQING, GU, YU, PING, PHAM, QUYEN, SMITH, PAUL

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Method and apparatus for measuring object thickness von CECILIA MARTNER, CHANG, YU, YU PING GU, PAUL SMITH, HUSTON, JOEL, SIQING LU, MILLER, G. LAURIE, LEI, LAWRENCE C, PHAM, QUYEN

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