Positive effect of CPAP treatment on the control of difficult-to-treat hypertension von Martinez-Garcia, M. A, Gomez-Aldaravi, R, Soler-Cataluna, J-J, Martinez, T. G, Bernacer-Alpera, B, Roman-Sanchez, P

Volltext

Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images von Gonnissen, J., De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., Van Aert, S.

Volltext

What Do You Get If You Cross a Phase Object Approximation with a Dynamically Scattering Sample? von Clark, L, O'Leary, Colum, Martinez, GT, Petersen, TC, Findlay, Scott, Nellist, Peter

Volltext

Procedure to count atoms with trustworthy single-atom sensitivity von Van Aert, S., De Backer, A., Martinez, G. T., Goris, B., Bals, S., Van Tendeloo, G., Rosenauer, A.

Volltext

Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations von De Backer, A., Martinez, G.T., Rosenauer, A., Van Aert, S.

Volltext

Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy von Martinez, G.T., Rosenauer, A., De Backer, A., Verbeeck, J., Van Aert, S.

Volltext

Scaled FinFETs Connected by Using Both Wafer Sides for Routing via Buried Power Rails von Veloso, A., Jourdain, A., Radisic, D., Chen, R., Arutchelvan, G., O'Sullivan, B., Arimura, H., Stucchi, M., De Keersgieter, A., Hosseini, M., Hopf, T., D'have, K., Wang, S., Dupuy, E., Mannaert, G., Vandersmissen, K., Iacovo, S., Marien, P., Choudhury, S., Schleicher, F., Sebaai, F., Oniki, Y., Zhou, X., Gupta, A., Schram, T., Briggs, B., Lorant, C., Rosseel, E., Hikavyy, A., Loo, R., Geypen, J., Batuk, D., Martinez, G. T., Soulie, J. P., Devriendt, K., Chan, B. T., Demuynck, S., Hiblot, G., Van der Plas, G., Ryckaert, J., Beyer, G., Litta, E. Dentoni, Beyne, E., Horiguchi, N.

Volltext

Site occupation of Nb atoms in ternary Ni–Ti–Nb shape memory alloys von Shi, H., Frenzel, J., Martinez, G.T., Van Rompaey, S., Bakulin, A., Kulkova, S., Van Aert, S., Schryvers, D.

Volltext

Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting von De Backer, A., Martinez, G.T., MacArthur, K.E., Jones, L., Béché, A., Nellist, P.D., Van Aert, S.

Volltext

Correction of non-linear thickness effects in HAADF STEM electron tomography von Van den Broek, W., Rosenauer, A., Goris, B., Martinez, G.T., Bals, S., Van Aert, S., Van Dyck, D.

Volltext

Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy von Martinez, G.T., van den Bos, K.H.W., Alania, M., Nellist, P.D., Van Aert, S.

Volltext

The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images von Martinez, G.T., De Backer, A., Rosenauer, A., Verbeeck, J., Van Aert, S.

Volltext

Quantitative STEM normalisation: The importance of the electron flux von Martinez, G.T., Jones, L., De Backer, A., Béché, A., Verbeeck, J., Van Aert, S., Nellist, P.D.

Volltext

Exploring the Limits of Focused-Probe STEM Ptychography von Nellist, P. D., Martinez, G. T., O’Leary, C., Jones, L.

Volltext

Atomic resolution mapping of phonon excitations in STEM-EELS experiments von Egoavil, R., Gauquelin, N., Martinez, G.T., Van Aert, S., Van Tendeloo, G., Verbeeck, J.

Volltext

Exploring the Validity Limits of Direct Ptychographic Methods to Analyse 4D Scanning Transmission Electron Microscopy Datasets von Clark, L, Martinez, GT, Liberti, E, O'Leary, CM, Yang, H, Petersen, TC, Paganin, DM, Kirkland, AI, Findlay, SD, Nellist, PD

Volltext

High‐throughput sequencing‐based analysis of bacterial communities associated with Barbour's seahorses (Hippocampus barbouri) from Surigao del Norte, Philippines von Ortega, R.C.M.H., Tabugo, S.R.M., Martinez, J.G.T., Padasas, C.S., Balolong, M.P., Balcázar, J.L.

Volltext

Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? von De Backer, A, De Wael, A, Gonnissen, J, Martinez, G T, Béché, A, MacArthur, K E, Jones, L, Nellist, P D, Van Aert, S

Volltext

Beyond the limits of imaging: advances and applications of model-based scanning transmission electron microscopy von Van Aert, S., Martinez, G.T., De Backer, A., Van Tendeloo, G., Rosenauer, A.

Volltext

Properties of Selectively Grown Si:P Layers below 500°C for Use in Stacked Nanosheet Devices von Rosseel, Erik, Porret, Clement, Hikavyy, Andriy Yakovitch, Loo, Roger, Richard, Olivier, Martinez, Gerardo Tadeo, Batuk, Dmitry, Mertens, Hans, Dentoni Litta, Eugenio, Horiguchi, Naoto

Volltext