EMPIRICAL BEST PREDICTION UNDER A NESTED ERROR MODEL WITH LOG TRANSFORMATION von Molina, Isabel, Martín, Nirian

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Robust approach for comparing two dependent normal populations through Wald-type tests based on Rényi’s pseudodistance estimators von Castilla, Elena, Jaenada, María, Martín, Nirian, Pardo, Leandro

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Robust Procedures for Estimating and Testing in the Framework of Divergence Measures von Pardo, Leandro, Martín, Nirian

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Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses von Balakrishnan, Narayanaswamy, Castilla, Elena, Martín, Nirian, Pardo, Leandro

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Robustness of Minimum Density Power Divergence Estimators and Wald-type test statistics in loglinear models with multinomial sampling von Calviño, Aida, Martín, Nirian, Pardo, Leandro

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Influence analysis of robust Wald-type tests von Ghosh, Abhik, Mandal, Abhijit, Martín, Nirian, Pardo, Leandro

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Trends in Mathematical, Information and Data Sciences: A Tribute to Leandro Pardo von Balakrishnan, Narayanaswamy, Gil, María Ángeles, Martín, Nirian, Morales, Domingo, Pardo, María del Carmen

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Diagnostics in a simple correspondence analysis model: An approach based on Cook’s distance for log-linear models von Martín, Nirian

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Using Cook's distance in polytomous logistic regression von Martín, Nirian

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Minimum phi-divergence estimators for multinomial logistic regression with complex sample design von Castilla, Elena, Martín, Nirian, Pardo, Leandro

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Model Selection in a Composite Likelihood Framework Based on Density Power Divergence von Castilla, Elena, Martín, Nirian, Pardo, Leandro, Zografos, Konstantinos

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A Wald-type test statistic for testing linear hypothesis in logistic regression models based on minimum density power divergence estimator von Basu, Ayanendranath, Ghosh, Abhik, Mandal, Abhijit, Martín, Nirian, Pardo, Leandro

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A Robust Wald-Type Test for Testing the Equality of Two Means from Log-Normal Samples von Basu, Ayanendranath, Mandal, Abhijit, Martín, Nirian, Pardo, Leandro

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Composite Likelihood Methods Based on Minimum Density Power Divergence Estimator von Castilla, Elena, Martín, Nirian, Pardo, Leandro, Zografos, Konstantinos

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Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model von Balakrishnan, Narayanaswamy, Castilla, Elena, Martin, Nirian, Pardo, Leandro

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New Robust Statistical Procedures for the Polytomous Logistic Regression Models von Castilla, Elena, Ghosh, Abhik, Martin, Nirian, Pardo, Leandro

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Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test von Balakrishnan, Narayanaswamy, Castilla, Elena, Martin, Nirian, Pardo, Leandro

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Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution von Balakrishnan, Narayanaswamy, Castilla, Elena, Martin, Nirian, Pardo, Leandro

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A Robust Generalization of the Rao Test von Basu, Ayanendranath, Ghosh, Abhik, Martin, Nirian, Pardo, Leandro

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On the asymptotic distribution of Cook's distance in logistic regression models von Martín, Nirian, Pardo, Leandro

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