NBTI model for analogue IC reliability simulation von Maricau, E, Gielen, G

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Stochastic circuit reliability analysis von Maricau, E, Gielen, G

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Designing reliable analog circuits in an unreliable world von Gielen, G. G. E., Maricau, E., De Wit, P.

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A compact NBTI model for accurate analog integrated circuit reliability simulation von Maricau, E., Leqi Zhang, Franco, J., Roussel, P., Groeseneken, G., Gielen, G.

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Design automation towards reliable analog integrated circuits von Gielen, G, Maricau, E, De Wit, P

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Advances in variation-aware modeling, verification, and testing of analog ICs von De Jonghe, Dimitri, Maricau, E., Gielen, G., McConaghy, T., Tasic, B., Stratigopoulos, H.

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Offset measurement method for accurate characterization of BTI-induced degradation in opamps von Mahato, S., De Wit, P., Maricau, E., Gielen, G.

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Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS von Bussche, S. V., De Wit, P., Maricau, E., Gielen, G.

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Emerging yield and reliability challenges in nanometer CMOS technologies von Gielen, G., De Wit, P., Maricau, E., Loeckx, J., Martín-Martínez, J., Kaczer, B., Groeseneken, G., Rodríguez, R., Nafría, M.

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