Chromosomal distribution of interstitial telomeric sequences as signs of evolution through chromosome fusion in six species of the giant water bugs (Hemiptera, Belostoma) von Chirino, Mónica G., Dalíková, Martina, Marec, František R., Bressa, María J.

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Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation von Mauguet, M., Andrianjohany, N., Lagarde, D., Gouyet, L., Azema, L., Chatry, N., Marie, X., Marec, R., Calvel, P., Standarovski, D., Ecoffet, R.

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Single Events Induced By Heavy Ions and Laser Pulses in Silicon Schottky Diodes von Mauguet, M., Lagarde, D., Widmer, F., Chatry, N., Marie, X., Lorfevre, E., Bezerra, F., Marec, R., Calvel, P.

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Modeling and Investigations on TID-ASETs Synergistic Effect in LM124 Operational Amplifier From Three Different Manufacturers von Roig, Fabien, Dusseau, L., Khachatrian, A., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Warner, J. H., Saigne, F., Buchner, S. P., McMorrow, D., Ribeiro, P., Auriel, G., Azais, B., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R.

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The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier von Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Saigne, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.

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Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier von Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaillé, J.-R, Boch, J., Saigné, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.

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Impact of Neutron-Induced Displacement Damage on the ATREE Response in LM124 Operational Amplifier von Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Saigne, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.

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Analysis in the Context of Space Radiation Hardness Assurance of Low Dose Rate Results Obtained With the MIL and ESCC Test Methods von Marec, R., Carlotti, J. F., Marin, M., Calvel, P., Barillot, C., Mancini, R., Sarno, M., Melotte, M., Cueto, J.

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Investigation and Analysis of LM124 Bipolar Linear Circuitry Response Phenomenon in Pulsed X-Ray Environment von Roche, N J, Dusseau, L, Vaille, J, Mekki, J, Velo, Y G, Perez, S, Boch, J, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Auriel, G, Azais, B

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Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated Circuits von Dusseau, L., Bernard, M., Boch, J., Gonzalez Velo, Y., Roche, N., Lorfevre, E., Bezerra, F., Calvel, P., Marec, R., Saigne, F.

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GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing von Bensoussan, A., Marec, R., Muraro, J.L., Portal, L., Calvel, P., Barillot, C., Perichaud, M.G., Marchand, L., Vignon, G.

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Development of a New Methodology to Model the Synergistic Effects Between TID and ASETs von Roche, N J-H, Dusseau, L, Boch, J, Velo, Y G, Vaille, J, Saigne, F, Auriel, G, Azais, B, Buchner, S P, Marec, R, Calvel, P, Bezerra, F

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Analysis of single-event transients in analog circuits von Adell, P., Schrimpf, R.D., Barnaby, H.J., Marec, R., Chatry, C., Calvel, P., Barillot, C., Mion, O.

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Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits von Roche, N.J.-H., Velo, Y.G., Dusseau, L., Boch, J., Vaille, J.-R., Saigne, F., Azais, B., Auriel, G., Lorfevre, E., Pouget, V., Buchner, S.P., David, J.-P., Marec, R., Calvel, P.

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Radiation test results on first silicon in the design against radiation effects (DARE) library von Redant, S., Marec, R., Baguena, L., Liegeon, E., Soucarre, J., Van Thielen, B., Beeckman, G., Ribeiro, P., Fernandez-Leon, A., Glass, B.

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Single Event-Induced Instability in Linear Voltage Regulators von Adell, P.C., Witulski, A.F., Schrimpf, R.D., Marec, R., Pouget, V., Calvel, P., Bezerra, F.

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Effects of Ion Species on SEB Failure Voltage of Power DMOSFET von Liu, S., Lauenstein, Jean-Marie, Ferlet-Cavrois, V., Marec, R., Hernandez, F., Scheick, L., Bezerra, F., Muschitiello, M., Poivey, C., Sukhaseum, N., Coquelet, L., Cao, H., Carrier, D., Brisebois, M. A., Mangeret, R., Ecoffet, R., LaBel, K., Zafrani, M., Sherman, P.

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Effects of reliability screening tests on bipolar integrated circuits during total dose irradiation von Barillot, C., Serres, O., Marec, R., Calvel, P.

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Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-Rays von Roche, N J.-H, Dusseau, L, Mekki, J, Perez, S, Vaille, J.-R, Gonzalez Velo, Yago, Boch, J, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Auriel, G, Azais, B, Buchner, S P

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Study of Synergism Effect Between TID and ATREE on the Response of the LM124 Operational Amplifier von Roche, N. J.-H, Perez, S., Mekki, J., Velo, Y. G., Dusseau, L., Boch, J., Vaille, J.-R, Saigne, F., Marec, R., Calvel, P., Bezerra, F., Auriel, G., Azais, B., Buchner, S. P.

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