Treffer 1 - 10 von 10 für Suche 'Mansour, Teymour M', Suchdauer: 0,49s Treffer weiter einschränken
  1. 1
    Configuration and testing of multiple-die integrated circuits

    Configuration and testing of multiple-die integrated circuits von MANSOUR TEYMOUR M, DESAI SHIVANI C, LUPU JULIAN, CHUNG LEE N

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  2. 2
    Method and apparatus for eliminating noise induced errors during test of a programmable logic device

    Method and apparatus for eliminating noise induced errors during test of a programmable logic device von Simmons, Randy J, Mansour, Teymour M

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  3. 3
    Method and apparatus for eliminating noise induced errors during test of a programmable logic device

    Method and apparatus for eliminating noise induced errors during test of a programmable logic device von MANSOUR TEYMOUR M, SIMMONS RANDY J

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  4. 4
    Method and apparatus for testing programmable integrated circuits

    Method and apparatus for testing programmable integrated circuits von ANDERSON ANDREW G, MANSOUR TEYMOUR M, STAMM RETO, MCEWEN IAN L

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  5. 5
    Method and apparatus for testing programmable integrated circuits

    Method and apparatus for testing programmable integrated circuits von McEwen, Ian L, Mansour, Teymour M, Anderson, Andrew G, Stamm, Reto

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  6. 6
    Methods of resource optimization in programmable logic devices to reduce test time

    Methods of resource optimization in programmable logic devices to reduce test time von Lai, Andrew W, Simmons, Randy J, Mansour, Teymour M, Tong, Vincent L, Lindholm, Jeffrey V, Young, Jay T, Troxel, William R, Krishnamurthy, Sridhar

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  7. 7
    Methods of resource optimization in programmable logic devices to reduce test time

    Methods of resource optimization in programmable logic devices to reduce test time von TONG VINCENT L, MANSOUR TEYMOUR M, LINDHOLM JEFFREY V, SIMMONS RANDY J, TROXEL WILLIAM R, YOUNG JAY T, KRISHNAMURTHY SRIDHAR, LAI ANDREW W

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  8. 8
    METHODS OF RESOURCE OPTIMIZATION IN PROGRAMMABLE LOGIC DEVICES TO REDUCE TEST TIME

    METHODS OF RESOURCE OPTIMIZATION IN PROGRAMMABLE LOGIC DEVICES TO REDUCE TEST TIME von TONG, VINCENT, L, MANSOUR, TEYMOUR, M, SIMMONS, RANDY, J, YOUNG, JAY, T, LINDHOLM, JEFFREY, V, KRISHNAMURTHY, SRIDHAR, LAI, ANDREW, W, TROXEL, WILLIAM, R

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  9. 9
    Methods of resource optimization in programmable logic devices to reduce test time

    Methods of resource optimization in programmable logic devices to reduce test time von TONG VINCENT L, MANSOUR TEYMOUR M, LINDHOLM JEFFREY V, SIMMONS RANDY J, TROXEL WILLIAM R, YOUNG JAY T, KRISHNAMURTHY SRIDHAR, LAI ANDREW W

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  10. 10
    METHODS OF RESOURCE OPTIMIZATION IN PROGRAMMABLE LOGIC DEVICES TO REDUCE TEST TIME

    METHODS OF RESOURCE OPTIMIZATION IN PROGRAMMABLE LOGIC DEVICES TO REDUCE TEST TIME von TONG, VINCENT, L, MANSOUR, TEYMOUR, M, SIMMONS, RANDY, J, YOUNG, JAY, T, LINDHOLM, JEFFREY, V, KRISHNAMURTHY, SRIDHAR, LAI, ANDREW, W, TROXEL, WILLIAM, R

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