Ferroelectric non-volatile memories for low-voltage, low-power applications von Jones, R.E., Maniar, P.D., Moazzami, R., Zurcher, P., Witowski, J.Z., Lii, Y.T., Chu, P., Gillespie, S.J.

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Memory applications based on ferroelectric and high-permittivity dielectric thin films von Jones, R.E., Zurcher, P., Chu, P., Taylor, D.J., Lii, Y.T., Jiang, B., Maniar, P.D., Gillespie, S.J.

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Energetics and structure of sol-gel silicas von Maniar, P.D., Navrotsky, A., Rabinovich, E.M., Ying, J.Y., Benziger, J.B.

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Energetics of high surface area silicas von Maniar, P.D, Navrotsky, A

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Phase transition in CaGeO3 perovskite : evidence from X-ray powder diffraction, thermal expansion and heat capacity von LIU, X, WANG, Y, LIEBERMANN, R. C, MANIAR, P. D, NAVROTSKY, A

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Integration of ferroelectric capacitor technology with CMOS von Moazzami, R., Maniar, P.D., Jones, R.E., Mogab, C.J.

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Ferroelectric PZT Thin Films For Low-voltage Nonvolatile Memory von Moazzami, R., Maniar, P.D., Jones, R.E., Campbell, A.C., Mogab, C.J.

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Novel methods for the reliability testing of ferroelectric DRAM storage capacitors von Sudhama, C., Khamankaar, R., Kim, J., Jiang, B., Lee, J.C., Maniar, P.D., Jones, R.E., Mogab, C.J.

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