THE COMPARATIVE RELIABILITY EVALUATION FOR THREE CONFIGURATION OF THE FAULT-TOLERANT SYSTEM WITH MAJORITY STRUCTURE von Mandziy, B.A., Volochyi, B.Y., Ozirkovsky, L.D., М.М., Zmysnyi, Muliak, O.V.

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Frequency domain simulation of the EM internal noises in the matrix VLSI with orthogonal topology of power supply feeding von Vasiltsov, I.V., Mandziy, B.A.

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Approach to solve the reliability problem at packaging level in the matrix VLSI von Vasiltsov, I.V., Mandziy, B.A., Bench, A.

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The structure of the software tool for reliability increasing of digital devices based on elementary coding von Vasyltsov, I.V., Mandziy, B.A., Glushko, A.A., Bench, A.Y.

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