High-resolution laboratory reflectometer for the study of x-ray optical elements in the soft and extreme ultraviolet wavelength ranges von Garakhin, S. A., Chkhalo, N. I., Kas’kov, I. A., Lopatin, A. Ya, Malyshev, I. V., Nechay, A. N., Pestov, A. E., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Tsybin, N. N., Zabrodin, I. G., Zuev, S. Yu

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Influence of a split double concentric ring resonator elements axial rotation on the microwave transmission line frequency-selective characteristics von Fedotov, A. A., Malyshev, I. V., Nikolaev, E. V., Il’in, O. I.

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Simulation of Local Error Correction of the Surface Shape by a Low-Dimensional Ion Beam von Chernyshev, A. K., Malyshev, I. V., Pestov, A. E., Chkhalo, N. I.

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Effects of interface-engineering on the internal structure and reflective characteristics of Cr/Sc multilayer mirrors von Smertin, R M, Barysheva, M M, Chkhalo, N I, Garakhin, S A, Malyshev, I V, Polkovnikov, V N

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Titanium-supported Ce-, Zr-containing oxide coatings modified by platinum or nickel and copper oxides and their catalytic activity in CO oxidation von Rudnev, V.S., Tyrina, L.M., Lukiyanchuk, I.V., Yarovaya, T.P., Malyshev, I.V., Ustinov, A. Yu, Nedozorov, P.M., Kaidalova, T.A.

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Project of X-Ray Optical Scheme of a Lithograph with a Transmissive Dynamic Mask and a Synchrotron Radiation Source von Malyshev, I. V., Chkhalo, N. I., Yakunin, S. N.

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High-aperture EUV microscope using multilayer mirrors and a 3D reconstruction algorithm based on z-tomography von Malyshev, I V, Reunov, D G, Chkhalo, N I, Toropov, M N, Pestov, A E, Polkovnikov, V N, Tsybin, N N, Lopatin, A Ya, Chernyshev, A K, Mikhailenko, M S, Smertin, R M, Pleshkov, R S, Shirokova, O M

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Substrates for Soft X-Ray Microscopy Based on Si3N4 Membranes von Reunov, D. G., Gusev, N. S., Mikhailenko, M. S., Petrova, D. V., Malyshev, I. V., Chkhalo, N. I.

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On the Stability of ZrO2 + TiO2 Coatings on Titanium Formed by Plasma Electrolytic Oxidation in a Chlorine-Containing Medium von Malyshev, I. V., Rudnev, V. S.

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Problems in the application of a null lens for precise measurements of aspheric mirrors von Chkhalo, N I, Malyshev, I V, Pestov, A E, Polkovnikov, V N, Salashchenko, N N, Toropov, M N, Soloviev, A A

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Comparison of Methods for Removing Noise in an Image Obtained in a Specular Microscope at a Wavelength of 13.84 nm von Reunov, D. G., Malyshev, I. V., Chkhalo, N. I.

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Diffraction limited X-ray optics: technology, metrology, applications von Chkhalo, N I, Malyshev, I V, Pestov, A E, Polkovnikov, V N, Salashchenko, N N, Toropov, M N

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The Application of Oil and Gas Drilling Waste in Fine-Grained Concrete von Yarusova, S. B., Skovpen, A. V., Ivanenko, N. V., Dostovalov, D. V., Malyshev, I. V., Gordienko, P. S., Kozin, A. V., Buravlev, I. Yu, Shlyk, D. Kh

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Search for High-Strength Multilayer Free-Standing Film Filters with High Transmittance in the Wavelength Range of the “Water Window” (2.3–4.4 nm) von Barysheva, M. M., Garakhin, S. A., Lopatin, A. Ya, Luchin, V. I., Malyshev, I. V., Salashchenko, N. N., Tsybin, N. N., Chkhalo, N. I.

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Soft X-ray Microscopy in Cell Biology: Current Status, Contributions and Prospects von Golyshev, S A, Kazakov, E P, Kireev, I I, Reunov, D G, Malyshev, I V

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Determining the Size of the EUV Laser-Plasma Source for a Microscope von Reunov, D. G., Malyshev, I. V., Perekalov, A. A., Nechay, A. N., Chkhalo, N. I.

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Wavefront Lens Corrector for Studying Flat Surfaces von Toropov, M. N., Akhsakhalyan, A. A., Malyshev, I. V., Mikhaylenko, M. S., Pestov, A. E., Salaschenko, N. N., Chernyshov, A. K., Chkhalo, N. I.

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Optimization of the Design and Parameters of a Double-Mirror Monochromator for the Fourth-Generation SKIF Synchrotron Light Source von Glushkov, E. I., Malyshev, I. V., Petrakov, E. V., Chkhalo, N. I., Khomyakov, Yu. V., Rakshun, Ya. V., Chernov, V. A., Dolbnya, I. P.

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Determination of the Bulk Conductivity of III–V Semiconductors in a Strong Constant Electric Field and under Harmonic Effects von Malyshev, I. V., Fil, K. A., Goncharova, O. A.

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Multilayer Cr/Sc Mirrors with Improved Reflection for the “Water Transparency Window” Range von Polkovnikov, V. N., Garakhin, S. A., Kvashennikov, D. S., Malyshev, I. V., Salashchenko, N. N., Svechnikov, M. V., Smertin, R. M., Chkhalo, N. I.

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