RF Extraction of Self-Heating Effects in FinFETs von Makovejev, S., Olsen, S., Raskin, J.

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Time and Frequency Domain Characterization of Transistor Self-Heating von Makovejev, S., Olsen, S. H., Kilchytska, V., Raskin, J-P

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Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications von Kilchytska, Valeriya, Makovejev, Sergej, Esfeh, Babak Kazemi, Nyssens, Lucas, Halder, Arka, Raskin, Jean-Pierre, Flandre, Denis

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A SPDT RF Switch Small- and Large-Signal Characteristics on TR-HR SOI Substrates von Kazemi Esfeh, Babak, Rack, Martin, Makovejev, Sergej, Allibert, Frederic, Raskin, Jean-Pierre

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Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime von Makovejev, Sergej, Esfeh, Babak, Andrieu, François, Raskin, Jean-Pierre, Flandre, Denis, Kilchytska, Valeriya

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(Digital Presentation) Substrate Effects in GaN-on-Si Hemt Technology for RF FEM Applications von Yadav, Sachin, Cardinael, Pieter, Zhao, Ming, Vondkar, Komal, Peralagu, Uthayasankaran, Alian, Alireza, Rodriguez, Raul, Khaled, Ahmad, Makovejev, Sergej, Ekoga, Enrique, Lederer, Dimitri, Raskin, Jean-Pierre, Parvais, Bertrand, Collaert, Nadine

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RF extraction of self-heating effects in FinFETs of various geometries von Makovejev, S, Olsen, S, Raskin, J

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