Refined extreme ultraviolet mask stack model von Makhotkin, I A, Wu, M, Soltwisch, V, Scholze, F, Philipsen, V

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Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures von Yakunin, S N, Makhotkin, I A, Nikolaev, K V, van de Kruijs, R W E, Chuev, M A, Bijkerk, F

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Low-energy ion polishing of Si in W/Si soft X-ray multilayer structures von Medvedev, R. V., Nikolaev, K. V., Zameshin, A. A., IJpes, D., Makhotkin, I. A., Yakunin, S. N., Yakshin, A. E., Bijkerk, F.

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Surface structure determination by x-ray standing waves at a free-electron laser von Mercurio, G, Makhotkin, I A, Milov, I, Kim, Y Y, Zaluzhnyy, I A, Dziarzhytski, S, Wenthaus, L, Vartanyants, I A, Wurth, W

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Determination the phase contact surface size of nitric acid with ammonia neutralization process for the ammonium nitrate production von Sakharov, I U, Makhotkin, A F, Sakharov, U N, Makhotkin, I A

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Hydrogenation dynamics of Ru capped Y thin films von Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Makhotkin, I. A., Nikolaev, K., Yakunin, S. N., Lee, C. J., Bijkerk, F.

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A semi‐analytical approach for the characterization of ordered 3D nanostructures using grazing‐incidence X‐ray fluorescence von Nikolaev, K. V., Soltwisch, V., Hönicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Bijkerk, F.

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Grazing‐incidence small‐angle X‐ray scattering study of correlated lateral density fluctuations in W/Si multilayers von Nikolaev, K. V., Yakunin, S. N., Makhotkin, I. A., Rie, J. de la, Medvedev, R. V., Rogachev, A. V., Trunckin, I. N., Vasiliev, A. L., Hendrikx, C. P., Gateshki, M., Kruijs, R. W. E. van de, Bijkerk, F.

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Study of ultrathin Pt/Co/Pt trilayers modified by nanosecond XUV pulses from laser-driven plasma source von Jacyna, I., Klinger, D., Pełka, J.B., Minikayev, R., Dłużewski, P., Dynowska, E., Jakubowski, M., Klepka, M.T., Zymierska, D., Bartnik, A., Kurant, Z., Wolska, A., Wawro, A., Sveklo, I., Plaisier, J.R., Eichert, D., Brigidi, F., Makhotkin, I., Maziewski, A., Sobierajski, R.

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Specular reflection intensity modulated by grazing‐incidence diffraction in a wide angular range von Nikolaev, K. V., Makhotkin, I. A., Yakunin, S. N., Kruijs, R. W. E. van de, Chuev, M. A., Bijkerk, F.

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Model independent x-ray standing wave analysis of periodic multilayer structures von Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Chuev, M. A., Pashaev, E. M., Zoethout, E., Louis, E., Seregin, S. Yu, Subbotin, I. A., Novikov, D. V., Bijkerk, F., Kovalchuk, M. V.

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Atomic separation in Co/Cu/Co magnetic structures study by hybrid X-ray reflectivity – X-ray standing wave approach von Kondratev, O.A., Makhotkin, I.A., Yakunin, S.N.

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Influence of noble gas ion polishing species on extreme ultraviolet mirrors von van den Boogaard, A. J. R., Zoethout, E., Makhotkin, I. A., Louis, E., Bijkerk, F.

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Two-level ablation and damage morphology of Ru films under femtosecond extreme UV irradiation von Milov, I., Zhakhovsky, V., Ilnitsky, D., Migdal, K., Khokhlov, V., Petrov, Yu, Inogamov, N., Lipp, V., Medvedev, N., Ziaja, B., Medvedev, V., Makhotkin, I.A., Louis, E., Bijkerk, F.

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Determination of the density of ultrathin La films in La/B4C layered structures using X-ray standing waves von Makhotkin, I. A., Louis, E., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Seregin, A. Yu, Tereschenko, E. Yu, Yakunin, S. N., Bijkerk, F.

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Similarity in ruthenium damage induced by photons with different energies: From visible light to hard X-rays von Milov, I., Lipp, V., Ilnitsky, D., Medvedev, N., Migdal, K., Zhakhovsky, V., Khokhlov, V., Petrov, Yu, Inogamov, N., Semin, S., Kimel, A., Ziaja, B., Makhotkin, I.A., Louis, E., Bijkerk, F.

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Post deposition nitridation of Si in W/Si soft X-ray multilayer systems von Medvedev, R.V., Hendrikx, C.P., Sturm, J.M., Yakunin, S.N., Makhotkin, I.A., Yakshin, A.E., Bijkerk, F.

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Mechanism of the process of decomposition of apatitis with phosphoric acid von Sabirov, R. F., Makhotkin, A. F., Sakharov, Yu. N., Makhotkin, I. A., Sakharov, I. Yu

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X-ray standing wave characterization of the strong metal-support interaction in Co/TiO x model catalysts von Tiwari, A, Monai, M, Matveevskii, K, Yakunin, SN, Mandemaker, LDB, Tsvetanova, M, Goodwin, MJ, Ackermann, MD, Meirer, F, Makhotkin, IA

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A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence von Nikolaev, K V, Soltwisch, V, Hoenicke, P, Scholze, F, de la Rie, J, Yakunin, S N, Makhotkin, I A, R W E van de Kruijs, Bijkerk, F

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