Stability of industrial gallium-doped Czochralski silicon PERC cells and wafers von Niewelt, T., Maischner, F., Kwapil, W., Khorani, E., Pain, S.L., Jung, Y., Hopkins, E.C.B., Frosch, M., Altermatt, P.P., Guo, H., Wang, Y.C., Grant, N.E., Murphy, J.D.

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LeTID mitigation via an adapted firing process in p-type PERC cells from SMART cast-monocrystalline, Czochralski and high-performance multicrystalline silicon von Maischner, F, Maus, S, Greulich, J, Lohmüller, S, Lohmüller, E, Saint-Cast, P, Ourinson, D, Vahlman, H, Hergert, K, Riepe, S, Glunz, S, Rein, S

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SMART Cast-Monocrystalline p-Type Silicon Passivated Emitter and Rear Cells: Efficiency Benchmark and Bulk Lifetime Analysis von Maus, S, Maischner, F, Riepe, S, Greulich, J, Lohmüller, E, Schindler, F, Saint-Cast, P, Krenckel, P, Hess, A, Lohmüller, S, Wolf, A, Preu, R

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