SWI/SNF family mutations in advanced NSCLC: genetic characteristics and immune checkpoint inhibitors’ therapeutic implication von Pang, L.-L., Zhou, H.-Q., Zhang, Y.-X., Zhuang, W.-T., Pang, F., Chen, L.-J., Liao, J., Huang, Y.-H., Mao, T.-Q., Mai, Z.-H., Zhang, L., Fang, W.-F.

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Two planar polishing methods by using FIB technique: Toward ultimate top-down delayering for failure analysis von Wang, D. D., Huang, Y. M., Tan, P. K., Feng, H., Low, G. R., Yap, H. H., He, R., Tan, H., Dawood, M. K., Zhao, Y. Z., Lam, J., Mai, Z. H.

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The effects of thermal annealing on ZnO thin films grown by pulsed laser deposition von Lu, Y. F., Ni, H. Q., Mai, Z. H., Ren, Z. M.

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Experimental evidence of the “dead layer” at Pt∕BaTiO3 interface von Li, X. L., Chen, B., Jing, H. Y., Lu, H. B., Zhao, B. R., Mai, Z. H., Jia, Q. J.

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Dry laser cleaning of particles from solid substrates: Experiments and theory von Zheng, Y. W., Luk’yanchuk, B. S., Lu, Y. F., Song, W. D., Mai, Z. H.

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Enhancement of exchange bias in Ir–Mn/Co0.9Fe0.1 bilayers by inserting an ultra-thin Co0.6Fe0.4 layer von Ni, Jing, Cai, J W, Lai, W Y, An, Y K, Mai, Z H

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Laser-induced nano-oxidation on hydrogen-passivated Ge (100) surfaces under a scanning tunneling microscope tip von Lu, Y. F., Mai, Z. H., Qiu, G., Chim, W. K.

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Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements von AN, Y. K, DAI, B, MAI, Z. H, CAI, J. W, WU, Z. H

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Effect of strain on the transport and magnetoresistance properties of La0.8Ca0.2MnO3 epitaxial thin films von Zhang, H D, Li, M, An, Y K, Mai, Z H, Gao, J, Hu, F X, Wang, Y, Jia, Q J

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Effectiveness of frequency mapping on 28 nm device broken scan chain failures von Goh, S. H., Pan, Yan, You, G. F., Chan, Y. H., ran, He, Herrman, Thomas, Heller, Thomas, Lim, Victor S. K., Mai, Z. H., Lam, Jeffrey, Chua, C. M., Chua, W. P., Tan, S. H.

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Incomplete transfer-induced interfacial roughening of Langmuir-Blodgett films von Li, M, Li, X.-H, Huang, L, Jia, Q.-J, Zheng, W.-L, Mai, Z.-H

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Microstructural changes of stearic acid films by immersion in salt solution von Li, X.-H., Li, M., Huang, L., Mai, Z.-H.

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Electrochromic writing and erasing on tungsten oxide films in air by scanning tunneling microscopy von Qiu, H., Lu, Y. F., Mai, Z. H.

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Influence of surfactant Ag on the structure of annealing Ni70Co30/Cu multilayers by X-ray reflection anomalous fine structure and X-ray absorption spectroscopy von AN, Y. K, ZHANG, H. D, MAI, Z. H, DAI, B, CAI, J. W, WU, Z. H, ZHOU, H. T, LIU, T

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Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2 von LIU, C. X, CHEN, X. M, CHEN, Z. J, WANG, Y, XU, M, LUO, G. M, MAI, Z. H, TANG, W. H, GAO, J, JIA, Q. J, ZHENG, W. L

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Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces von LU, Y. F, MAI, Z. H, SONG, W. D, CHIM, W. K

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Automated TEM Sample Preparation from Smaller Device Structure Regions of Semiconductor ICs using Inline Dual-Beam CLM+ and TEMLink 150 von Rai, R.S., Chen, E., Zhang, Y., Nedeau, D., Chen, Y., Zhao, W., Lim, S.K., Mai, Z.-H., Lam, J.

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Effective Utilization of STEM Imaging Capability in FIB for Physical Failure Analysis on 20nm & 14nm Transistor Nodes in Semiconductor Wafer Foundries von Zhao, W., Nedeau, D., Kodali, S., Huang, J., Oh, C.-K., Lim, S.-K., Rai, R., Mai, Z.-H., Lam, J.

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An Effective Approach to Extract Cross-Sectional Information from Top-Down SEM for 20nm & 14nm Transistor Nodes in Semiconductor Wafer-Foundries von Zhao, W., Wei, Y., Oh, C.-K., Kodali, S., Schaeffer, T., Lim, S.-K., Rai, R., Mai, Z.-H., Lam, J.

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Microstructural studies of YB2Cu3O7-δ/Nd2CuO4/YB2Cu3O7-δ Josephson junctions with a Nd2CuO4 buffer layer grown on YSZ substrate von LI, X. L, LI, M, MAI, Z. H, GAO, J, XU, H. R

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