320 \times 240 Back-Illuminated 10- \mu \text CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor von Kato, Yuichi, Sano, Takuya, Moriyama, Yusuke, Maeda, Shunji, Yamazaki, Takeshi, Nose, Atsushi, Shiina, Kimiyasu, Yasu, Yohtaro, van der Tempel, Ward, Ercan, Alper, Ebiko, Yoshiki, Van Nieuwenhove, Daniel, Sukegawa, Shunichi

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Causal Relationship Analysis Method using Forecast Error Variance Decomposition based on Sensor Common Frequency for Exhaust-Gas Fluctuation Analysis von MORIYAMA, Takeru, NISHIMURA, Koki, NAGATANI, Tomohiro, MAEDA, Shunji

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サポートベクトル回帰による多地点時系列データを用いた風速予測におけるk-NNとVARによる学習データ選択の検討 von 湯山, 藍美, 山先, 純也, 水野, 太介, 長谷, 智紘, 森山, 健, 西村, 晃紀, 前田, 俊二, 高橋, 雅也, 田中, 和英, 星平, 祐吾

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Study on Learning Image Generation Using Deep Convolutional Auto-encoder for Defect Inspection Sensitivity Control in Electronic Component Inspection von YANABE, Masaki, OOI, Kentarou, TANAKA, Tomohiro, NISHIMURA, Koki, MAEDA, Shunji

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Study of Anomaly Detection on Tracking of Residual Vector based on Subspace Method von MAEDA, Shunji, SHIBUYA, Hisae

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Consideration on New Fuzzy Information Theory based on Fuzzy Logical Sentences von ARAKI, Tomoyuki, SUZUKI, Takashi, OHASHI, Yu, MAEDA, Shunji

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RANGING SYSTEM, CALIBRATION METHOD, PROGRAM, AND ELECTRONIC APPARATUS von Maeda, Shunji

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OPTICAL MODULE AND DISTANCE-MEASURING DEVICE von MAEDA, SHUNJI

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OPTICAL DISTANCE MEASUREMENT DEVICE AND OPTICAL DISTANCE MEASUREMENT METHOD von MAEDA, Shunji

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DISTANCE MEASUREMENT APPARATUS AND DETECTION METHOD von MAEDA, SHUNJI

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Unified evaluation method of white uniformity for electronic displays von Asano, Toshio, Kondo, Takahiro, Maeda, Shunji

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Proposal of Extraction Method of Inherent Striated Toolmarks for Bullet Discrimination using Histogram Intersection von NISHIMURA, Koki, MAEDA, Shunji, ARAKI, Tomoyuki, KANEKO, Shun'ichi, SHIBUYA, Hisae, NITOBE, Tsutomu, YASUNO, Takuya, IIZUKA, Masami, NAKAYAMA, Toru

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Color Uniformity Evaluation of Electronic Displays Based on Visual Characteristics von KONDO, Takahiro, TAKAGI, Yuji, MAEDA, Shunji, ASANO, Tosho

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Highly-Sensitive Combined Inspection Method for LSI Patterns Based on Die-to-Golden Die Comparison with Stratified_Thresholding and Self-reference Comparison von MAEDA, Shunji, SAKAI, Kaoru, URANO, Takahiro

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Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison von Maeda, Shunji, Endo, Fumiaki, Makihira, Hiroshi, Kubota, Hitoshi

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OPTISCHES MODUL UND ABSTANDSMESSVORRICHTUNG von Maeda, Shunji

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A Proposal of Stage Motion Measurement Method Using Image Analysis von MAEDA, Shunji, YOSHIDA, Minoru, OKA, Kenji

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ニューラルネットワークによる多地点時系列データを用いた風速予測におけるVARによるデータ選択の検討 von 長谷, 智紘, 森山, 健, 西村, 晃紀, 前田, 俊二

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電子部品検査における欠陥検査感度制御のためのDeep Convolutional Auto-encoderを用いた学習画像生成の検討 von 柳部, 正樹, 大井, 健太郎, 田中, 智裕, 西村, 晃紀, 前田, 俊二

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OPTICAL MODULE AND DISTANCE MEASUREMENT DEVICE von MAEDA, Shunji

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