In-line liquid-crystal microcell polarimeter for high-speed polarization analysis von Acharya, Bharat R, Madsen, C K, Baldwin, K W, MacHarrie, R A, Rogers, J A, Möller, L, Huang, C C, Pindak, R

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Direct structure determination of systems with two-dimensional periodicity von Yacoby, Y, Pindak, R, MacHarrie, R, Pfeiffer, L, Berman, L, Clarke, R

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In-fiber nematic liquid crystal optical modulator based on in-plane switching with microsecond response time von Acharya, Bharat R., Baldwin, K. W., MacHarrie, R. A., Rogers, John A., Huang, C. C., Pindak, R.

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In-line liquid-crystal microcell wave plates and their application for high-speed, reset-free polarization mode dispersion compensation in 40-Gbit/s systems von Acharya, Bharat R, Möller, Lothar, Baldwin, Kirk W, MacHarrie, Robert A, Stepnoski, Ray A, Huang, Cheng C, Pindak, Ron, Rogers, John A

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Epitaxially stabilized GexSn1-x diamond cubic alloys von FITZGERALD, E. A, FREELAND, P. E, COOPER, S. L, THOMAS, G. A, KIMERLING, L. C, ASOM, M. T, LOWE, W. P, MACHARRIE, R. A, WEIR, B. E, KORTAN, A. R, THIEL, F. A, XIE, Y.-H, SERGENT, A. M

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Synchrotron radiation applications of charge coupled device detectors (invited) von Clarke, Roy, Lowe, Walter P., MacHarrie, R. A., Brizard, C., Rodricks, B. G.

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Real-time X-ray diffraction observation of a pin-slip mechanism in GexSi1-x strained layers von LOWE, W, MACHARRIE, R. A, BEAN, J. C, PETICOLAS, L, CLARKE, R, DOS PASSOS, W, BRIZARD, C, RODRICKS, B

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Optimization of distributed resistive metal film heaters in thermally tunable dispersion compensators for high-bit-rate communication systems von Steinvurzel, Paul, MacHarrie, Robert A, Baldwin, Kirk W, Van Hise, Charles W, Eggleton, Benjamin J, Rogers, John A

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Heteroepitaxy of YBa2Cu3O7 thin films on (100) cubic zirconia von WILLIAMS, M. D, LOWE, W. P, STRAUGHN, B, MACHARRIE, R, MANKIEWICH, P. M, HOWARD, R. E

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In situ X-ray diffraction of the early stages of the crystallization of Fe80B20 von Brizard, C., Rodricks, B., Alp, E., Macharrie, R.

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In situ x-ray diffraction of the early stages of the crystallization of Fe{sub 80}B{sub 20} von Brizard, C., Rodricks, B., Alp, E., MacHarrie, R., APS

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In Situ X-Ray Diffraction of the Early Stages of the Crystallization of Fe sub 80 B sub 20 von Brizard, C, Rodricks, B, Alp, E, Macharrie, R

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In situ X-ray diffraction of the early stages of the crystalliztion of Fe80B20 von BRIZARD, C, RODRICKS, B, ALP, E, MACHARRIE, R

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Real-time x-ray diffraction observation of a pin-slip mechanism in Ge x Si 1 − x strained layers von Lowe, W., MacHarrie, R. A., Bean, J. C., Peticolas, L., Clarke, R., Dos Passos, W., Brizard, C., Rodricks, B.

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Heteroepitaxy of YBa 2Cu 3O 7 thin films on (100) cubic zirconia von Williams, M.D., Lowe, W.P., Straughn, B., Macharrie, R., Mankiewich, P.M., Howard, R.E.

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In-line liquid crystal microcell polarimeters and waveplates for high speed polarization analysis and control von Acharya, B., Madsen, C., Baldwin, K., Macharrie, R., Rogers, J., Moeller, L., Huang, C., Pindak, R.

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High speed liquid crystal devices for polarization control and analysis von Acharya, B.R., Madsen, C.K., Moller, L., Baldwin, K., MacHarrie, R.A., Stepnoski, R.A., Hunag, C.C., Pindak, R., Rogers, J.

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Fast Tunable In-Line Liquid Crystal Based Polarization Controller for Reset Free Operation von Acharya, B.R., Moller, L., Baldwin, K.W., MacHarrie, R.A., Huang, C.C., Pindak, R., Rogers, J.A.

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DIRECT ATOMIC STRUCTURE DETERMINATION OF EPITAXIALLY GROWN FILMS: GAAS: GD2O3 von SOWWAN,M., YACOBY,Y., PITNEY,J., MACHARRIE,R., HONG,M., CROSS,J., WALKO,D., CLARKE,R., PINDAK,R., STERN,E.

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Direct atomic structure determination of epitaxially grown films: Gd 2 O 3 on GaAs(100) von Sowwan, M., Yacoby, Y., Pitney, J., MacHarrie, R., Hong, M., Cross, J., Walko, D. A., Clarke, R., Pindak, R., Stern, E. A.

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