Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images von E, H., MacArthur, K.E., Pennycook, T.J., Okunishi, E., D'Alfonso, A.J., Lugg, N.R., Allen, L.J., Nellist, P.D.

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Optimal ADF STEM imaging parameters for tilt-robust image quantification von MacArthur, K.E., D’Alfonso, A.J., Ozkaya, D., Allen, L.J., Nellist, P.D.

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Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting von De Backer, A., Martinez, G.T., MacArthur, K.E., Jones, L., Béché, A., Nellist, P.D., Van Aert, S.

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Compositional quantification of PtCo acid-leached fuel cell catalysts using EDX partial cross sections von MacArthur, K. E., Slater, T. J. A., Haigh, S. J., Ozkaya, D., Nellist, P. D., Lozano-Perez, S.

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How Flat is Your Detector? Non-Uniform Annular Detector Sensitivity in STEM Quantification von MacArthur, K.E., Jones, L., Nellist, P.D.

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Grand Rounds: The Opportunity for and Challenges to Malaria Eradication von Mace, K.E, Lynch, M.F, MacArthur, J.R, Kachur, S.P, Slutsker, L

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