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  1. 1
    Focused ion beam assisted semiconductor sample preparation for subsequent transmission electron microscope examination

    Focused ion beam assisted semiconductor sample preparation for subsequent transmission electron microscope examination von Myasishchev, Denis

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    Dissertation

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  2. 2
    Effects of Growth Temperature on Indium Incorporation in InAlN Alloys Grown by GSMBE on Si(111)

    Effects of Growth Temperature on Indium Incorporation in InAlN Alloys Grown by GSMBE on Si(111) von Uddin, Md Rakib, Pandikunta, Mahesh, Mansurov, Vladimir, Sohal, Sandeep, Myasishchev, Denis, Guryanov, Georgiy M., Kuryatkov, Vladimir, Holtz, Mark, Nikishin, Sergey

    Veröffentlicht in Journal of electronic materials

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    Artikel

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  3. 3
    LASER ABLATION-BASED SURFACE PROPERTY MODIFICATION AND CONTAMINATION REMOVAL

    LASER ABLATION-BASED SURFACE PROPERTY MODIFICATION AND CONTAMINATION REMOVAL von MAZUR, Andrew V, MYASISHCHEV, Denis, NICKERSON, Robert M, MUTHUR SRINATH, Purushotham Kaushik, GOKHALE, Shripad

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    Patent

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  4. 4
    LASER ABLATION-BASED SURFACE PROPERTY MODIFICATION AND CONTAMINATION REMOVAL

    LASER ABLATION-BASED SURFACE PROPERTY MODIFICATION AND CONTAMINATION REMOVAL von MAZUR, Andrew V, MYASISHCHEV, Denis, NICKERSON, Robert M, MUTHUR SRINATH, Purushotham Kaushik, GOKHALE, Shripad

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    Patent

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